Multiple testing for pattern identification, with applications to microarray time-course experiments

Journal of the American Statistical Association

Volumn 106, Issue 493, 2011, Pages 73-88

  Sun, Wenguang ^a   Wei, Zhi ^b  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b University Heights   (United States)

Author keywords

Compound decision problem; Conjunction and partial conjunction tests; False discovery rate; Hidden markov models; Microarray time course data; Simultaneous set wise testing

Indexed keywords

EID: 79954483579     PISSN: 01621459     EISSN: None     Source Type: Journal    
DOI: 10.1198/jasa.2011.ap09587     Document Type: Article

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