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Volumn 550, Issue , 2014, Pages 90-94

Deposition and x-ray characterization of epitaxial thin films of LaAlO 3

Author keywords

Atomic layer deposition; Interface effects; Lanthanum aluminate; Synchrotron diffraction

Indexed keywords

EPITAXIAL RELATIONSHIPS; INTERFACE EFFECT; INTERFACE RECONSTRUCTION; LANTHANUM ALUMINATE; LINEAR RELATIONSHIPS; STOICHIOMETRIC COMPOSITIONS; SYNCHROTRON DIFFRACTION; X-RAY CHARACTERIZATION;

EID: 84890312248     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2013.10.139     Document Type: Article
Times cited : (10)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.