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Volumn 20, Issue 4, 2013, Pages 644-647

On the application of a single-crystal κ-diffractometer and a CCD area detector for studies of thin films

Author keywords

epitaxial thin films; six axis diffractometer; synchrotron X ray diffraction

Indexed keywords

EPITAXIAL RELATIONS; EPITAXIAL RELATIONSHIPS; EPITAXIAL THIN FILMS; GEOMETRICAL FLEXIBILITY; IN-DEPTH UNDERSTANDING; SIX-AXIS; SYNCHROTRON X RAY DIFFRACTION; THIN-FILM STRUCTURE;

EID: 84879168195     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049513009102     Document Type: Article
Times cited : (5)

References (23)
  • 12
    • 3242688784 scopus 로고    scopus 로고
    • Oxford Diffraction. Oxford Diffraction Ltd Abingdon Oxfordshire, England
    • Oxford Diffraction (2006). CrysAlis CCD. Oxford Diffraction Ltd, Abingdon, Oxfordshire, England.
    • (2006) CrysAlis CCD


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.