메뉴 건너뛰기




Volumn , Issue , 2013, Pages

Investigation of oscillations in a 6.5-kV, 1-kA SiC diode module

Author keywords

Diode; Noise; Silicon Carbide (SiC); Simulation

Indexed keywords

BEHAVIORAL MODEL; DEVICE CHARACTERIZATION; HIGH FREQUENCY OSCILLATIONS; NOISE; SI-BASED DEVICES; SILICON CARBIDES (SIC); SIMULATION; SNUBBER CIRCUIT;

EID: 84890175249     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPE.2013.6634484     Document Type: Conference Paper
Times cited : (2)

References (14)
  • 2
    • 72949102922 scopus 로고    scopus 로고
    • Power device-induced oscillations and electromagnetic disturbances
    • Springer Berlin Heidelberg
    • J. Lutz, H. Schlangenotto, U. Scheuermann, and R. Doncker, "Power device-induced oscillations and electromagnetic disturbances," in Semiconductor Power Devices. Springer Berlin Heidelberg, 2011, pp. 475-495.
    • (2011) Semiconductor Power Devices , pp. 475-495
    • Lutz, J.1    Schlangenotto, H.2    Scheuermann, U.3    Doncker, R.4
  • 3
    • 0030110724 scopus 로고    scopus 로고
    • Analysis of the impact of pulse-width modulated inverter voltage Waveforms on ac induction motors
    • A. Bonnett, "Analysis of the impact of pulse-width modulated inverter voltage Waveforms on ac induction motors," IEEE Trans. Ind. Appl., vol. 32, no. 2, pp. 386-392, 1996.
    • (1996) IEEE Trans. Ind. Appl , vol.32 , Issue.2 , pp. 386-392
    • Bonnett, A.1
  • 6
    • 84860284218 scopus 로고    scopus 로고
    • The impact of parasitic inductance on the performance of silicon-carbide Schottky barrier diodes
    • Aug
    • O. Alatise, N.-A. Parker-Allotey, D. Hamilton, and P. Mawby, "The impact of parasitic inductance on the performance of silicon-carbide Schottky barrier diodes," IEEE Trans. Power Electron., vol. 27, no. 8, pp. 3826-3833, Aug. 2012.
    • (2012) IEEE Trans. Power Electron , vol.27 , Issue.8 , pp. 3826-3833
    • Alatise, O.1    Parker-Allotey, N.-A.2    Hamilton, D.3    Mawby, P.4
  • 7
    • 84860313217 scopus 로고    scopus 로고
    • Improving sic jfet switching behavior under influence of circuit parasitics
    • Aug
    • I. Josifovic, J. Popovic-Gerber, and J. Ferreira, "Improving SiC JFET switching behavior under influence of circuit parasitics," IEEE Trans. Power Electron., vol. 27, no. 8, pp. 3843-3854, Aug. 2012.
    • (2012) IEEE Trans. Power Electron , vol.27 , Issue.8 , pp. 3843-3854
    • Josifovic, I.1    Popovic-Gerber, J.2    Ferreira, J.3
  • 9
    • 84875168748 scopus 로고    scopus 로고
    • Stability considerations for silicon carbide field-effect transistors
    • A. Lemmon, M. Mazzola, J. Gafford, and C. Parker, "Stability considerations for silicon carbide field-effect transistors," IEEE Trans. Power Electron., vol. 28, no. 10, pp. 4453-4459, 2013.
    • (2013) IEEE Trans. Power Electron , vol.28 , Issue.10 , pp. 4453-4459
    • Lemmon, A.1    Mazzola, M.2    Gafford, J.3    Parker, C.4
  • 11
    • 70049097910 scopus 로고    scopus 로고
    • Parallel connection of integrated gate commutated thyristors (IGCTs) and diodes
    • Sep
    • R. Hermann, S. Bernet, Y. Suh, and P. Steimer, "Parallel connection of integrated gate commutated thyristors (IGCTs) and diodes," IEEE Trans. Power Electron., vol. 24, no. 9, pp. 2159-2170, Sep. 2009.
    • (2009) IEEE Trans. Power Electron , vol.24 , Issue.9 , pp. 2159-2170
    • Hermann, R.1    Bernet, S.2    Suh, Y.3    Steimer, P.4
  • 12
    • 77955463702 scopus 로고    scopus 로고
    • 6.5 kv sic pin diodes With improved forward characteristics
    • Trans Tech Publ, Apr
    • D. Peters,W. Bartsch, B. Thomas, and R. Sommer, "6.5 kV SiC PiN diodes With improved forward characteristics," in Materials Science Forum, vol. 645-648. Trans Tech Publ, Apr. 2010, pp. 901-904.
    • (2010) Materials Science Forum , vol.645-648 , pp. 901-904
    • Peters, D.1    Bartsch, W.2    Thomas, B.3    Sommer, R.4
  • 14
    • 0035272707 scopus 로고    scopus 로고
    • Freewheeling diode reverse-recovery failure modes in IGBT applications
    • Mar./Apr
    • M. Rahimo and N. Shammas, "Freewheeling diode reverse-recovery failure modes in IGBT applications," IEEE Trans. Ind. Appl., vol. 37, no. 2, pp. 661-670, Mar./Apr. 2001.
    • (2001) IEEE Trans. Ind. Appl , vol.37 , Issue.2 , pp. 661-670
    • Rahimo, M.1    Shammas, N.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.