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Volumn 32, Issue 6, 2013, Pages 2683-2706

Diagnostics of analog circuits based on LS-SVM using time-domain features

Author keywords

Analog circuits; Diagnostics; Feature selection; Feature vector; Least squares support vector machine; Time domain features

Indexed keywords

FEATURE SELECTION METHODS; FEATURE VECTORS; LEAST SQUARES SUPPORT VECTOR MACHINES; MEAN AND STANDARD DEVIATIONS; NEURAL NETWORKS (NNS); STATISTICAL PROPERTIES; SUPPORT VECTOR MACHINE (SVMS); TIME DOMAIN;

EID: 84889844770     PISSN: 0278081X     EISSN: 15315878     Source Type: Journal    
DOI: 10.1007/s00034-013-9614-3     Document Type: Article
Times cited : (56)

References (31)
  • 1
    • 0033897037 scopus 로고    scopus 로고
    • Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor
    • 10.1109/82.823545
    • M. Aminian, F. Aminian, Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor. IEEE Trans. Circuits Syst. II, Express Briefs 47, 151-156 (2000)
    • (2000) IEEE Trans. Circuits Syst. II, Express Briefs , vol.47 , pp. 151-156
    • Aminian, M.1    Aminian, F.2
  • 2
    • 0035678439 scopus 로고    scopus 로고
    • Fault diagnosis of nonlinear circuits using neural networks with wavelet and Fourier transforms as preprocessors
    • 10.1023/A:1012864504306
    • F. Aminian, M. Aminian, Fault diagnosis of nonlinear circuits using neural networks with wavelet and Fourier transforms as preprocessors. J. Electron. Test., Theory Appl. 17, 471-481 (2001)
    • (2001) J. Electron. Test., Theory Appl. , vol.17 , pp. 471-481
    • Aminian, F.1    Aminian, M.2
  • 3
    • 0036612713 scopus 로고    scopus 로고
    • Analog fault diagnosis of actual circuits using neural networks
    • 10.1109/TIM.2002.1017726
    • F. Aminian, M. Aminian, Analog fault diagnosis of actual circuits using neural networks. IEEE Trans. Instrum. Meas. 51, 544-550 (2002)
    • (2002) IEEE Trans. Instrum. Meas. , vol.51 , pp. 544-550
    • Aminian, F.1    Aminian, M.2
  • 4
    • 34648822354 scopus 로고    scopus 로고
    • A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor
    • 10.1109/TIM.2007.904549
    • M. Aminian, F. Aminian, A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor. IEEE Trans. Instrum. Meas. 56, 1546-1554 (2007)
    • (2007) IEEE Trans. Instrum. Meas. , vol.56 , pp. 1546-1554
    • Aminian, M.1    Aminian, F.2
  • 5
    • 84871227284 scopus 로고    scopus 로고
    • A.NET framework for an integrated fault diagnosis and failure prognosis architecture
    • Orlando, FL
    • C. Chen, D. Brown, C. Sconyers, G. Vachtsevanos, B. Zhang, M.E. Orchard, A.NET framework for an integrated fault diagnosis and failure prognosis architecture, in IEEE Autotestcon, Orlando, FL (2010), pp. 1-6
    • (2010) IEEE Autotestcon , pp. 1-6
    • Chen, C.1    Brown, D.2    Sconyers, C.3    Vachtsevanos, G.4    Zhang, B.5    Orchard, M.E.6
  • 6
    • 80051722734 scopus 로고    scopus 로고
    • Machine condition prediction based on adaptive neuro-fuzzy and high-order particle filtering
    • 10.1109/TIE.2010.2098369
    • C. Chen, B. Zhang, G. Vachtsevanos, M. Orchard, Machine condition prediction based on adaptive neuro-fuzzy and high-order particle filtering. IEEE Trans. Ind. Electron. 58, 4353-4364 (2011)
    • (2011) IEEE Trans. Ind. Electron. , vol.58 , pp. 4353-4364
    • Chen, C.1    Zhang, B.2    Vachtsevanos, G.3    Orchard, M.4
  • 7
    • 78650012085 scopus 로고    scopus 로고
    • A novel approach of analog circuit fault diagnosis using support vector machines classifier
    • 10.1016/j.measurement.2010.10.004
    • J. Cui, Y.R. Wang, A novel approach of analog circuit fault diagnosis using support vector machines classifier. Measurement 44, 281-289 (2011)
    • (2011) Measurement , vol.44 , pp. 281-289
    • Cui, J.1    Wang, Y.R.2
  • 8
    • 84864804663 scopus 로고    scopus 로고
    • Prognostic-based risk mitigation for telecom equipment under free air cooling conditions
    • 10.1016/j.apenergy.2012.05.055
    • J. Dai, D. Das, M. Pecht, Prognostic-based risk mitigation for telecom equipment under free air cooling conditions. Appl. Energy 99, 423-429 (2012)
    • (2012) Appl. Energy , vol.99 , pp. 423-429
    • Dai, J.1    Das, D.2    Pecht, M.3
  • 9
    • 0036505670 scopus 로고    scopus 로고
    • A comparison of methods for multi-class support vector machines
    • 10.1109/TNN.2002.1000139
    • C.W. Hsu, C.J. Lin, A comparison of methods for multi-class support vector machines. IEEE Trans. Neural Netw. 13, 415-425 (2002)
    • (2002) IEEE Trans. Neural Netw. , vol.13 , pp. 415-425
    • Hsu, C.W.1    Lin, C.J.2
  • 10
    • 79955626219 scopus 로고    scopus 로고
    • Support vector machine with genetic algorithm for machinery fault diagnosis of high voltage circuit breaker
    • 10.1016/j.measurement.2011.02.017
    • J. Huang, X. Hu, F. Yang, Support vector machine with genetic algorithm for machinery fault diagnosis of high voltage circuit breaker. Measurement 44, 1018-1027 (2011)
    • (2011) Measurement , vol.44 , pp. 1018-1027
    • Huang, J.1    Hu, X.2    Yang, F.3
  • 14
    • 74549145103 scopus 로고    scopus 로고
    • Fault diagnosis of analog circuit based on support vector machines
    • Beijing
    • Y.H. Liu, Y.Y. Yang, H. Huang, Fault diagnosis of analog circuit based on support vector machines, in Proc. of ICCTA2009, Beijing (2009), pp. 40-43
    • (2009) Proc. of ICCTA2009 , pp. 40-43
    • Liu, Y.H.1    Yang, Y.Y.2    Huang, H.3
  • 15
    • 58149166361 scopus 로고    scopus 로고
    • Least squares support vector machine based analog-circuit fault diagnosis using wavelet transform as preprocessor
    • Fujian
    • B. Long, S.L. Tian, H.J. Wang, Least squares support vector machine based analog-circuit fault diagnosis using wavelet transform as preprocessor, in ICCCAS08, Fujian (2008), pp. 1026-1029
    • (2008) ICCCAS08 , pp. 1026-1029
    • Long, B.1    Tian, S.L.2    Wang, H.J.3
  • 16
    • 81055138975 scopus 로고    scopus 로고
    • Research on features for diagnostics of filtered analog circuits based on LS-SVM
    • Baltimore, MD
    • B. Long, S.L. Tian, Q. Miao, M. Pecht, Research on features for diagnostics of filtered analog circuits based on LS-SVM, in IEEE Autotestcon, Baltimore, MD (2011), pp. 360-366
    • (2011) IEEE Autotestcon , pp. 360-366
    • Long, B.1    Tian, S.L.2    Miao, Q.3    Pecht, M.4
  • 17
    • 84862167982 scopus 로고    scopus 로고
    • Diagnostics of filtered analog circuits with tolerance based on LS-SVM using frequency features
    • 10.1007/s10836-011-5275-y
    • B. Long, S.L. Tian, H.J. Wang, Diagnostics of filtered analog circuits with tolerance based on LS-SVM using frequency features. J. Electron. Test., Theory Appl. 28, 291-300 (2012)
    • (2012) J. Electron. Test., Theory Appl. , vol.28 , pp. 291-300
    • Long, B.1    Tian, S.L.2    Wang, H.J.3
  • 19
    • 0020735031 scopus 로고
    • Analog multifrequency fault diagnosis
    • 10.1109/TCS.1983.1085352
    • L. Rapisarda, R. Decarlo, Analog multifrequency fault diagnosis. IEEE Trans. Circuits Syst. 30, 223-234 (1983)
    • (1983) IEEE Trans. Circuits Syst. , vol.30 , pp. 223-234
    • Rapisarda, L.1    Decarlo, R.2
  • 20
    • 0024140959 scopus 로고
    • Fault diagnosis under a limited-fault assumption and limited test-point availability
    • 982127 10.1007/BF01599922
    • L. Rapisarda, R. Decarlo, Fault diagnosis under a limited-fault assumption and limited test-point availability. Circuits Syst. Signal Process. 7, 481-510 (1988)
    • (1988) Circuits Syst. Signal Process. , vol.7 , pp. 481-510
    • Rapisarda, L.1    Decarlo, R.2
  • 22
    • 59349085132 scopus 로고    scopus 로고
    • Evolutionary derivation of optimal test sets for neural network based analog and mixed signal circuits fault diagnosis approach
    • 10.1016/j.microrel.2008.12.002
    • M.S.J. Seyyed, K. Mohammadi, Evolutionary derivation of optimal test sets for neural network based analog and mixed signal circuits fault diagnosis approach. Microelectron. Reliab. 49, 199-208 (2009)
    • (2009) Microelectron. Reliab. , vol.49 , pp. 199-208
    • Seyyed, M.S.J.1    Mohammadi, K.2
  • 24
  • 26
    • 79951611617 scopus 로고    scopus 로고
    • N-Skart: A nonsequential skewness- and auto regression-adjusted batch-means procedure for simulation analysis
    • 2761085 10.1109/TAC.2010.2052137
    • A. Tafazzoli, N.M. Steiger, J.R. Wilson, N-Skart: a nonsequential skewness- and auto regression-adjusted batch-means procedure for simulation analysis. IEEE Trans. Autom. Control 56, 254-264 (2011)
    • (2011) IEEE Trans. Autom. Control , vol.56 , pp. 254-264
    • Tafazzoli, A.1    Steiger, N.M.2    Wilson, J.R.3
  • 27
    • 34248644353 scopus 로고    scopus 로고
    • Signature testing of analog and RF circuits: Algorithms and methodology
    • 10.1109/TCSI.2007.895531
    • R. Voorakaranam, S.S. Akbay, Signature testing of analog and RF circuits: algorithms and methodology. IEEE Trans. Circuits Syst. I, Regul. Pap. 54, 1018-1031 (2007)
    • (2007) IEEE Trans. Circuits Syst. I, Regul. Pap. , vol.54 , pp. 1018-1031
    • Voorakaranam, R.1    Akbay, S.S.2
  • 28
    • 78650062029 scopus 로고    scopus 로고
    • Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis
    • 10.1109/TIM.2010.2050356
    • C.L. Yang, S.L. Tian, B. Long, Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis. IEEE Trans. Instrum. Meas. 60, 176-185 (2011)
    • (2011) IEEE Trans. Instrum. Meas. , vol.60 , pp. 176-185
    • Yang, C.L.1    Tian, S.L.2    Long, B.3
  • 29
    • 76849099291 scopus 로고    scopus 로고
    • A new neural-network-based fault diagnosis approach for analog circuits by using kurtosis and entropy as a preprocessor
    • 10.1109/TIM.2009.2025068
    • L.F. Yuan, Y.G. He, J.Y. Huang, Y.C. Sun, A new neural-network-based fault diagnosis approach for analog circuits by using kurtosis and entropy as a preprocessor. IEEE Trans. Instrum. Meas. 59, 586-595 (2010)
    • (2010) IEEE Trans. Instrum. Meas. , vol.59 , pp. 586-595
    • Yuan, L.F.1    He, Y.G.2    Huang, J.Y.3    Sun, Y.C.4
  • 30
    • 40949136972 scopus 로고    scopus 로고
    • One-class classifier based on SBT for analog circuit fault diagnosis
    • 10.1016/j.measurement.2007.02.007
    • Y. Zhang, X.Y. Wei, H.F. Jiang, One-class classifier based on SBT for analog circuit fault diagnosis. Measurement 41, 371-380 (2008)
    • (2008) Measurement , vol.41 , pp. 371-380
    • Zhang, Y.1    Wei, X.Y.2    Jiang, H.F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.