-
1
-
-
0033897037
-
Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor
-
10.1109/82.823545
-
M. Aminian, F. Aminian, Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor. IEEE Trans. Circuits Syst. II, Express Briefs 47, 151-156 (2000)
-
(2000)
IEEE Trans. Circuits Syst. II, Express Briefs
, vol.47
, pp. 151-156
-
-
Aminian, M.1
Aminian, F.2
-
2
-
-
0035678439
-
Fault diagnosis of nonlinear circuits using neural networks with wavelet and Fourier transforms as preprocessors
-
10.1023/A:1012864504306
-
F. Aminian, M. Aminian, Fault diagnosis of nonlinear circuits using neural networks with wavelet and Fourier transforms as preprocessors. J. Electron. Test., Theory Appl. 17, 471-481 (2001)
-
(2001)
J. Electron. Test., Theory Appl.
, vol.17
, pp. 471-481
-
-
Aminian, F.1
Aminian, M.2
-
3
-
-
0036612713
-
Analog fault diagnosis of actual circuits using neural networks
-
10.1109/TIM.2002.1017726
-
F. Aminian, M. Aminian, Analog fault diagnosis of actual circuits using neural networks. IEEE Trans. Instrum. Meas. 51, 544-550 (2002)
-
(2002)
IEEE Trans. Instrum. Meas.
, vol.51
, pp. 544-550
-
-
Aminian, F.1
Aminian, M.2
-
4
-
-
34648822354
-
A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor
-
10.1109/TIM.2007.904549
-
M. Aminian, F. Aminian, A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor. IEEE Trans. Instrum. Meas. 56, 1546-1554 (2007)
-
(2007)
IEEE Trans. Instrum. Meas.
, vol.56
, pp. 1546-1554
-
-
Aminian, M.1
Aminian, F.2
-
5
-
-
84871227284
-
A.NET framework for an integrated fault diagnosis and failure prognosis architecture
-
Orlando, FL
-
C. Chen, D. Brown, C. Sconyers, G. Vachtsevanos, B. Zhang, M.E. Orchard, A.NET framework for an integrated fault diagnosis and failure prognosis architecture, in IEEE Autotestcon, Orlando, FL (2010), pp. 1-6
-
(2010)
IEEE Autotestcon
, pp. 1-6
-
-
Chen, C.1
Brown, D.2
Sconyers, C.3
Vachtsevanos, G.4
Zhang, B.5
Orchard, M.E.6
-
6
-
-
80051722734
-
Machine condition prediction based on adaptive neuro-fuzzy and high-order particle filtering
-
10.1109/TIE.2010.2098369
-
C. Chen, B. Zhang, G. Vachtsevanos, M. Orchard, Machine condition prediction based on adaptive neuro-fuzzy and high-order particle filtering. IEEE Trans. Ind. Electron. 58, 4353-4364 (2011)
-
(2011)
IEEE Trans. Ind. Electron.
, vol.58
, pp. 4353-4364
-
-
Chen, C.1
Zhang, B.2
Vachtsevanos, G.3
Orchard, M.4
-
7
-
-
78650012085
-
A novel approach of analog circuit fault diagnosis using support vector machines classifier
-
10.1016/j.measurement.2010.10.004
-
J. Cui, Y.R. Wang, A novel approach of analog circuit fault diagnosis using support vector machines classifier. Measurement 44, 281-289 (2011)
-
(2011)
Measurement
, vol.44
, pp. 281-289
-
-
Cui, J.1
Wang, Y.R.2
-
8
-
-
84864804663
-
Prognostic-based risk mitigation for telecom equipment under free air cooling conditions
-
10.1016/j.apenergy.2012.05.055
-
J. Dai, D. Das, M. Pecht, Prognostic-based risk mitigation for telecom equipment under free air cooling conditions. Appl. Energy 99, 423-429 (2012)
-
(2012)
Appl. Energy
, vol.99
, pp. 423-429
-
-
Dai, J.1
Das, D.2
Pecht, M.3
-
9
-
-
0036505670
-
A comparison of methods for multi-class support vector machines
-
10.1109/TNN.2002.1000139
-
C.W. Hsu, C.J. Lin, A comparison of methods for multi-class support vector machines. IEEE Trans. Neural Netw. 13, 415-425 (2002)
-
(2002)
IEEE Trans. Neural Netw.
, vol.13
, pp. 415-425
-
-
Hsu, C.W.1
Lin, C.J.2
-
10
-
-
79955626219
-
Support vector machine with genetic algorithm for machinery fault diagnosis of high voltage circuit breaker
-
10.1016/j.measurement.2011.02.017
-
J. Huang, X. Hu, F. Yang, Support vector machine with genetic algorithm for machinery fault diagnosis of high voltage circuit breaker. Measurement 44, 1018-1027 (2011)
-
(2011)
Measurement
, vol.44
, pp. 1018-1027
-
-
Huang, J.1
Hu, X.2
Yang, F.3
-
12
-
-
0033336093
-
Benchmark circuits for analog and mixed-signal testing
-
Lexington, KY
-
R. Kondagunturi, E. Bradley, K. Maggard, C. Stroud, Benchmark circuits for analog and mixed-signal testing, in Proc. of IEEE Southeastcon'99, Lexington, KY (1999), pp. 217-220
-
(1999)
Proc. of IEEE Southeastcon'99
, pp. 217-220
-
-
Kondagunturi, R.1
Bradley, E.2
Maggard, K.3
Stroud, C.4
-
14
-
-
74549145103
-
Fault diagnosis of analog circuit based on support vector machines
-
Beijing
-
Y.H. Liu, Y.Y. Yang, H. Huang, Fault diagnosis of analog circuit based on support vector machines, in Proc. of ICCTA2009, Beijing (2009), pp. 40-43
-
(2009)
Proc. of ICCTA2009
, pp. 40-43
-
-
Liu, Y.H.1
Yang, Y.Y.2
Huang, H.3
-
15
-
-
58149166361
-
Least squares support vector machine based analog-circuit fault diagnosis using wavelet transform as preprocessor
-
Fujian
-
B. Long, S.L. Tian, H.J. Wang, Least squares support vector machine based analog-circuit fault diagnosis using wavelet transform as preprocessor, in ICCCAS08, Fujian (2008), pp. 1026-1029
-
(2008)
ICCCAS08
, pp. 1026-1029
-
-
Long, B.1
Tian, S.L.2
Wang, H.J.3
-
16
-
-
81055138975
-
Research on features for diagnostics of filtered analog circuits based on LS-SVM
-
Baltimore, MD
-
B. Long, S.L. Tian, Q. Miao, M. Pecht, Research on features for diagnostics of filtered analog circuits based on LS-SVM, in IEEE Autotestcon, Baltimore, MD (2011), pp. 360-366
-
(2011)
IEEE Autotestcon
, pp. 360-366
-
-
Long, B.1
Tian, S.L.2
Miao, Q.3
Pecht, M.4
-
17
-
-
84862167982
-
Diagnostics of filtered analog circuits with tolerance based on LS-SVM using frequency features
-
10.1007/s10836-011-5275-y
-
B. Long, S.L. Tian, H.J. Wang, Diagnostics of filtered analog circuits with tolerance based on LS-SVM using frequency features. J. Electron. Test., Theory Appl. 28, 291-300 (2012)
-
(2012)
J. Electron. Test., Theory Appl.
, vol.28
, pp. 291-300
-
-
Long, B.1
Tian, S.L.2
Wang, H.J.3
-
19
-
-
0020735031
-
Analog multifrequency fault diagnosis
-
10.1109/TCS.1983.1085352
-
L. Rapisarda, R. Decarlo, Analog multifrequency fault diagnosis. IEEE Trans. Circuits Syst. 30, 223-234 (1983)
-
(1983)
IEEE Trans. Circuits Syst.
, vol.30
, pp. 223-234
-
-
Rapisarda, L.1
Decarlo, R.2
-
20
-
-
0024140959
-
Fault diagnosis under a limited-fault assumption and limited test-point availability
-
982127 10.1007/BF01599922
-
L. Rapisarda, R. Decarlo, Fault diagnosis under a limited-fault assumption and limited test-point availability. Circuits Syst. Signal Process. 7, 481-510 (1988)
-
(1988)
Circuits Syst. Signal Process.
, vol.7
, pp. 481-510
-
-
Rapisarda, L.1
Decarlo, R.2
-
22
-
-
59349085132
-
Evolutionary derivation of optimal test sets for neural network based analog and mixed signal circuits fault diagnosis approach
-
10.1016/j.microrel.2008.12.002
-
M.S.J. Seyyed, K. Mohammadi, Evolutionary derivation of optimal test sets for neural network based analog and mixed signal circuits fault diagnosis approach. Microelectron. Reliab. 49, 199-208 (2009)
-
(2009)
Microelectron. Reliab.
, vol.49
, pp. 199-208
-
-
Seyyed, M.S.J.1
Mohammadi, K.2
-
25
-
-
0037695279
-
-
World Scientific Singapore 10.1142/9789812776655
-
J.A.K. Suykens, T.V. Gestel, J.D. Brabanter, B.D. Moor, J. Vandewalle, Least Squares Support Vector Machines (World Scientific, Singapore, 2002)
-
(2002)
Least Squares Support Vector Machines
-
-
Suykens, J.A.K.1
Gestel, T.V.2
Brabanter, J.D.3
Moor, B.D.4
Vandewalle, J.5
-
26
-
-
79951611617
-
N-Skart: A nonsequential skewness- and auto regression-adjusted batch-means procedure for simulation analysis
-
2761085 10.1109/TAC.2010.2052137
-
A. Tafazzoli, N.M. Steiger, J.R. Wilson, N-Skart: a nonsequential skewness- and auto regression-adjusted batch-means procedure for simulation analysis. IEEE Trans. Autom. Control 56, 254-264 (2011)
-
(2011)
IEEE Trans. Autom. Control
, vol.56
, pp. 254-264
-
-
Tafazzoli, A.1
Steiger, N.M.2
Wilson, J.R.3
-
27
-
-
34248644353
-
Signature testing of analog and RF circuits: Algorithms and methodology
-
10.1109/TCSI.2007.895531
-
R. Voorakaranam, S.S. Akbay, Signature testing of analog and RF circuits: algorithms and methodology. IEEE Trans. Circuits Syst. I, Regul. Pap. 54, 1018-1031 (2007)
-
(2007)
IEEE Trans. Circuits Syst. I, Regul. Pap.
, vol.54
, pp. 1018-1031
-
-
Voorakaranam, R.1
Akbay, S.S.2
-
28
-
-
78650062029
-
Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis
-
10.1109/TIM.2010.2050356
-
C.L. Yang, S.L. Tian, B. Long, Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis. IEEE Trans. Instrum. Meas. 60, 176-185 (2011)
-
(2011)
IEEE Trans. Instrum. Meas.
, vol.60
, pp. 176-185
-
-
Yang, C.L.1
Tian, S.L.2
Long, B.3
-
29
-
-
76849099291
-
A new neural-network-based fault diagnosis approach for analog circuits by using kurtosis and entropy as a preprocessor
-
10.1109/TIM.2009.2025068
-
L.F. Yuan, Y.G. He, J.Y. Huang, Y.C. Sun, A new neural-network-based fault diagnosis approach for analog circuits by using kurtosis and entropy as a preprocessor. IEEE Trans. Instrum. Meas. 59, 586-595 (2010)
-
(2010)
IEEE Trans. Instrum. Meas.
, vol.59
, pp. 586-595
-
-
Yuan, L.F.1
He, Y.G.2
Huang, J.Y.3
Sun, Y.C.4
-
30
-
-
40949136972
-
One-class classifier based on SBT for analog circuit fault diagnosis
-
10.1016/j.measurement.2007.02.007
-
Y. Zhang, X.Y. Wei, H.F. Jiang, One-class classifier based on SBT for analog circuit fault diagnosis. Measurement 41, 371-380 (2008)
-
(2008)
Measurement
, vol.41
, pp. 371-380
-
-
Zhang, Y.1
Wei, X.Y.2
Jiang, H.F.3
-
31
-
-
77953203601
-
Applying wavelet support vector machine to analog circuit fault diagnosis
-
Wuhan
-
L. Zuo, L.G. Hou, W. Zhang, W.C. Wu, Applying wavelet support vector machine to analog circuit fault diagnosis, in 2010 Second International Workshop on Education Technology and Computer Science, Wuhan (2010), pp. 75-78
-
(2010)
2010 Second International Workshop on Education Technology and Computer Science
, pp. 75-78
-
-
Zuo, L.1
Hou, L.G.2
Zhang, W.3
Wu, W.C.4
|