Research on features for diagnostics of filtered analog circuits based on LS-SVM

AUTOTESTCON (Proceedings)

Volumn , Issue , 2011, Pages 360-366

  Long, Bing ^a,b   Tian, Shulin ^a   Miao, Qiang ^a,b   Pecht, Michael ^b  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

diagnostics; feature selection; feature vector; filtered analog circuits; frequency features; least squares support vector machine (LS SVM); time domain features

Indexed keywords

BIQUAD FILTER; COMBINED FEATURES; DIAGNOSTIC ACCURACY; DIAGNOSTIC METHODS; EXPERIMENT DATA; FAULT SAMPLE; FEATURE VECTORS; FREQUENCY FEATURES; FREQUENCY-RESPONSE CURVES; GLOBAL PROPERTIES; LEAST SQUARES SUPPORT VECTOR MACHINES; PHYSICAL MEANINGS; RESPONSE CURVES; SIMULATION DATA; STATISTICAL PROPERTIES; TIME DOMAIN; TIME-DOMAIN SIMULATIONS; TRANSIENT RESPONSE DATA; WAVELET COEFFICIENTS; WAVELET TRANSFORM COEFFICIENTS;

DIAGNOSIS; FEATURE EXTRACTION; FREQUENCY RESPONSE; IMAGE RETRIEVAL; LEAST SQUARES APPROXIMATIONS; MAINTENANCE; PLASMA DIAGNOSTICS; SUPPORT VECTOR MACHINES; TIME DOMAIN ANALYSIS; VECTORS; WAVELET TRANSFORMS;

ANALOG CIRCUITS;

EID: 81055138975     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AUTEST.2011.6058746     Document Type: Conference Paper

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