Diagnostics of filtered analog circuits with tolerance based on LS-SVM using frequency features

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 28, Issue 3, 2012, Pages 291-300

  Long, Bing ^a   Tian, Shulin ^a   Wang, Houjun ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Conventional frequency features; Diagnostics; Filtered analog circuits; Least squares support vector machine (LS SVM); Wavelet features

Indexed keywords

CENTER FREQUENCY; COMBINED FEATURES; DIAGNOSTIC ACCURACY; FEATURE VECTORS; FILTER SYSTEM; FREQUENCY CHARACTERISTIC; FREQUENCY FEATURES; LEAST SQUARE; LEAST SQUARES SUPPORT VECTOR MACHINES; OPTIMAL WAVELETS; SIMULATION DATA; STANDARD DEVIATION; TIME DOMAIN; WAVELET COEFFICIENTS; WAVELET ENERGY; WAVELET FEATURE VECTORS; WAVELET FEATURES;

FREQUENCY RESPONSE; OPTIMIZATION; PLASMA DIAGNOSTICS; TIME DOMAIN ANALYSIS; VECTORS; WAVELET TRANSFORMS;

SUPPORT VECTOR MACHINES;

EID: 84862167982     PISSN: 09238174     EISSN: 15730727     Source Type: Journal    
DOI: 10.1007/s10836-011-5275-y     Document Type: Article

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