One-class classifier based on SBT for analog circuit fault diagnosis

Measurement: Journal of the International Measurement Confederation

Volumn 41, Issue 4, 2008, Pages 371-380

  Yi, Zhang ^a   Xueye, Wei ^a   Haifeng, Jiang ^a  

^a BEIJING JIAOTONG UNIVERSITY   (China)

Author keywords

Analog circuits; Fault classes; Fault diagnosis; One class classifiers; SBT (simulation before test)

Indexed keywords

ANALOG CIRCUITS; DATA ACQUISITION; FAULT TOLERANCE; FAULT TOLERANT COMPUTER SYSTEMS;

COMPONENT TOLERANCES; FAULT CLASSES; ONE CLASS CLASSIFIERS; SBT (SIMULATION BEFORE TEST);

CIRCUIT SIMULATION;

EID: 40949136972     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2007.02.007     Document Type: Article

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