Preferential scattering by interfacial charged defects for enhanced thermoelectric performance in few-layered n-type Bi 2 Te 3

Scientific Reports

Volumn 3, Issue , 2013, Pages

  Puneet, Pooja ^a   Podila, Ramakrishna ^a,b   Karakaya, Mehmet ^a   Zhu, Song ^a   He, Jian ^a   Tritt, Terry M ^a   Dresselhaus, Mildred S ^c   Rao, Apparao M ^a,b  

^a CLEMSON UNIVERSITY   (United States)

^b Clemson University   (United States)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84889590918     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep03212     Document Type: Article

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