Thermoelectric efficiency and compatibility

Physical Review Letters

Volumn 91, Issue 14, 2003, Pages 148301/1-148301/4

  Snyder, G Jeffrey ^a   Ursell, Tristan S ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; FUNCTIONALLY GRADED MATERIALS; INTEGRAL EQUATIONS; OHMIC CONTACTS; PELTIER EFFECT; SEEBECK EFFECT; THERMOELECTRIC EQUIPMENT;

OHM LAW VOLTAGE DROP; THERMOELECTRIC COMPATIBILITY; THERMOELECTRIC EFFICIENCY; THERMOELECTRIC POWER GENERATION; THOMSON COEFFICIENT;

THERMOELECTRICITY;

EID: 0242593304     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.91.148301     Document Type: Article

References (15)

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15. T. S. Ursell and G. J. Snyder, in Proceedings of the 21st International Conference on Thermoelectrics (IEEE, New York, 2000), p. 412. Figures and tables in [15] calculate u a factor of 2 smaller than defined here.