A normal-incidence PtSi photoemissive detector with black silicon light-trapping

Journal of Applied Physics

Volumn 114, Issue 18, 2013, Pages

  Steglich, Martin ^a   Zilk, Matthias ^a   Bingel, Astrid ^a,b   Patzig, Christian ^c   Käsebier, Thomas ^a   Schrempel, Frank ^a   Kley, Ernst Bernhard ^a,b   Tünnermann, Andreas ^a,b  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

^c FRAUNHOFER INSTITUTE FOR MECHANICS OF MATERIALS IWM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BLACK SILICON; DETECTOR PERFORMANCE; EXTERNAL QUANTUM EFFICIENCY; IR SPECTRAL RANGE; LIGHT-TRAPPING; OPTICAL WINDOW; RESPONSIVITY; ROOM TEMPERATURE DETECTION;

DETECTORS; SILICON DETECTORS;

SILICON;

EID: 84887920955     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4829897     Document Type: Article

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