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Volumn 3, Issue 4, 2013, Pages 319-327

Growth mechanism of ZnO nanostructures for ultra-high piezoelectric d33 coefficient

Author keywords

Current voltage (I V) characteristic; Nanostructures; Piezoelectric Force Microscopy (PFM); Scanning electron microscopy (SEM); X ray diffraction (XRD); ZnO

Indexed keywords


EID: 84887689398     PISSN: 21585849     EISSN: 21585857     Source Type: Journal    
DOI: 10.1166/mex.2013.1134     Document Type: Review
Times cited : (37)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.