Exploring the XPS limit in soft and hard x-ray angle-resolved photoemission using a temperature-dependent one-step theory

Physical Review B - Condensed Matter and Materials Physics

Volumn 88, Issue 20, 2013, Pages

  Braun, J ^a   Minar J ^a   Mankovsky, S ^a   Strocov, V N ^b   Brookes, N B ^c   Plucinski, L ^d,e   Schneider, C M ^d,e   Fadley, C S ^f,g   Ebert, H ^a  

^a UNIVERSITY OF MUNICH   (Germany)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d FORSCHUNGSZENTRUM JÜLICH   (Germany)

^e UNIVERSITY OF DUISBURG ESSEN   (Germany)

^f LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^g UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84887574094     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.88.205409     Document Type: Article

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