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Journal of Electron Spectroscopy and Related Phenomena

Volumn 181, Issue 1, 2010, Pages 48-55

Soft X-ray ARPES and fermiology of strongly correlated electron systems and PES by hard X-ray and extremely low energy photons

(2) Suga, Shigemasa a Sekiyama, Akira a

a OSAKA UNIVERSITY (Japan)

Author keywords

ARPES; Bulk sensitivity; Fermi surface; Hard and soft X rays; High resolution; Recoil effects

Indexed keywords

ARPES; BULK SENSITIVITY; HIGH RESOLUTION; RECOIL EFFECT; SOFT X-RAY;

ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; ELECTRONS; FERMI SURFACE; FERMIONS; KRYPTON; MULTILAYERS; PHOTONS; SUN; X RAY LITHOGRAPHY; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS; XENON;

SURFACES;

EID: 77955420483 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2010.05.022 Document Type: Conference Paper

Times cited : (10)

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