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Physical Review B - Condensed Matter and Materials Physics

Volumn 88, Issue 17, 2013, Pages

Quantification of octahedral rotations in strained LaAlO3 films via synchrotron x-ray diffraction

(15) Johnson Wilke, R L a Marincel, D a Zhu, S b Warusawithana, M P c Hatt, A d Sayre, J e Delaney, K T e Engel Herbert, R a Schleputz C M f Kim, J W f Gopalan, V a Spaldin, N A g Schlom, D G b Ryan, P J f Trolier Mckinstry, S a

a PENNSYLVANIA STATE UNIVERSITY (United States)

b Cornell University (United States)

c Florida State University (United States)

d LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

e University of California (United States)

f ARGONNE NATIONAL LABORATORY (United States)

g ETH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84887546337 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.88.174101 Document Type: Article

Times cited : (42)

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