Octahedral tilt transitions in relaxed epitaxial Pb(Zr1-xTi x)O3 films

Journal of Applied Physics

Volumn 109, Issue 9, 2011, Pages

  Tinberg, Daniel S ^a   Johnson Wilke, Raegan L ^a   Fong, Dillon D ^b   Fister, Timothy T ^b   Streiffer, Stephen K ^b   Han, Yisong ^c   Reaney, Ian M ^c   Trolier Mckinstry, Susan ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC BEHAVIOR; FERROELECTRIC PHASE TRANSITION TEMPERATURES; FERROELECTRIC POLARIZATION; FERROELECTRIC RESPONSE; HIGH RESOLUTION; ORIENTED FILMS; PSEUDOCUBIC; PZT; SYNCHROTRON X RAY DIFFRACTION;

DIFFRACTION; EPITAXIAL GROWTH; FERROELECTRIC MATERIALS; FERROELECTRICITY; HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LEAD; PHASE DIAGRAMS; PULSED LASER DEPOSITION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; ZIRCONIUM;

FERROELECTRIC FILMS;

EID: 79959493275     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3580328     Document Type: Article

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