Structural phase transitions in AgTa0.5Nb0.5O 3 thin films

Journal of Applied Physics

Volumn 107, Issue 12, 2010, Pages

  Han, Y ^a,f   Reaney, I M ^a   Johnson Wilke, R L ^b   Telli, M B ^c   Tinberg, D S ^b   Levin, I ^d   Fong, D D ^e   Fister, T T ^e   Streiffer, S K ^e   Trolier Mckinstry, S ^b  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c KOCAELI UNIVERSITY   (Turkey)

^d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^e ARGONNE NATIONAL LABORATORY   (United States)

^f UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIPHASE ROTATIONS; BULK MATERIALS; CATION DISPLACEMENTS; COMPLEX SEQUENCES; CORRELATION LENGTHS; HIGH RESOLUTION X RAY DIFFRACTION; IN-PHASE; LONG RANGE ORDERS; OCTAHEDRAL ROTATIONS; PLANAR DEFECT; PSEUDOCUBIC; RELATIVE PERMITTIVITY; SPACE GROUPS; STRUCTURAL PHASE TRANSITION;

FILMS; LANTHANUM ALLOYS; MATERIALS HANDLING EQUIPMENT; POSITIVE IONS; ROTATION; X RAY DIFFRACTION;

PHASE TRANSITIONS;

EID: 77954182977     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3447753     Document Type: Article

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