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Volumn 20, Issue 6, 2013, Pages

Processing-structure-property correlation in DC sputtered molybdenum thin films

Author keywords

films; Molybdenum; PVD; resistivity; sputtering; strain

Indexed keywords

CHAMBER PRESSURE; GLASS SUBSTRATES; HIGH PRESSURE; INTERFACIAL STRENGTH; LOW PRESSURES; POOR ADHESION; RESIDUAL STRAINS; VAN DER PAUW METHOD;

EID: 84887082362     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X13500650     Document Type: Article
Times cited : (2)

References (14)
  • 3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.