The optical and structural properties of polycrystalline Cu(In,Ga)(Se,S)2 absorber thin films

Journal of Materials Science

Volumn 46, Issue 21, 2011, Pages 6981-6987

  Dejene, F B ^a  

^a UNIVERSITY OF THE FREE STATE   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOUND SEMICONDUCTORS; CU(IN ,GA)(SE ,S)2; DIFFUSION BEHAVIOR; ELECTRON DIFFRACTION SPECTROSCOPIES; ELEVATED TEMPERATURE; GAS CONCENTRATION; HIGH QUALITY; HIGH-EFFICIENCY SOLAR CELLS; MAGNETRON SPUTTER; PHOTOLUMINESCENCE MEASUREMENTS; POLYCRYSTALLINE; REACTION TEMPERATURE; SCANNING ELECTRON MICROSCOPE; SELENIZATION; SINGLE PHASE; SODA LIME GLASS SUBSTRATE; SOLAR SPECTRUM; TUNABLE BAND-GAP; TWO-STEP GROWTH;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; COPPER; DIFFRACTION; GALLIUM ALLOYS; MAGNETRON SPUTTERING; MAGNETRONS; MOLYBDENUM; OPTICAL PROPERTIES; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING FILMS; SEMICONDUCTING SELENIUM COMPOUNDS; SEMICONDUCTOR GROWTH; SUBSTRATES; SULFUR; SURFACE STRUCTURE; THIN FILMS; X RAY DIFFRACTION;

OPTICAL FILMS;

EID: 80052073286     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-011-5666-6     Document Type: Article

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