Domain wall roughness in stripe phase BiFeO3 thin films

Physical Review Letters

Volumn 111, Issue 24, 2013, Pages

  Ziegler, B ^a   Martens, K ^a,b   Giamarchi, T ^a   Paruch, P ^a  

^a UNIVERSITY OF GENEVA   (Switzerland)

^b LIPHY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIPOLAR INTERACTION; DOMAIN WALL ROUGHNESS; ELASTIC INTERFACES; FERROELECTRIC DOMAINS; PERIODIC ORDERING; PIEZORESPONSE FORCE MICROSCOPY; ROUGHNESS EXPONENT; STRIPE DOMAIN;

FERROELECTRIC MATERIALS; SCANNING PROBE MICROSCOPY; THIN FILMS;

DOMAIN WALLS;

EID: 84887014370     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.111.247604     Document Type: Article

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