Step bunching-induced vertical lattice mismatch and crystallographic tilt in vicinal BiFeO3(001) films

Applied Physics Letters

Volumn 98, Issue 2, 2011, Pages

  Kim, T H ^a   Baek, S H ^b   Jang, S Y ^a   Yang, S M ^a   Chang, S H ^a   Song, T K ^c   Yoon, J G ^d   Eom, C B ^b   Chung, J S ^e   Noh, T W ^a  

^a Seoul National University   (South Korea)

^b University of Wisconsin Madison   (United States)

^c Changwon National University   (South Korea)

^d Suwon University   (South Korea)

^e Soongsil University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC STRESS; CRYSTALLOGRAPHIC TILT; SRTIO; STEP BUNCHING; X-RAY DIFFRACTION TECHNIQUES;

SOIL CONSERVATION; X RAY DIFFRACTION;

LATTICE MISMATCH;

EID: 78751522541     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3535981     Document Type: Article

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