Observation of graphene bubbles and effective mass transport under graphene films

Nano Letters

Volumn 9, Issue 1, 2009, Pages 332-337

  Stolyarova, E ^a,b,c   Stolyarov, D ^a,b,c   Bolotin, K ^a,b,c   Ryu, S ^a,b,c   Liu, L ^a,b,c   Rim, K T ^a,b,c   Klima, M ^a,b,c   Hybertsen, M ^a,b,c   Pogorelsky, L ^a,b,c   Pavlishin, L ^a,b,c   Kusche, K ^a,b,c   Horie, J ^a,b,c   Kim, P ^a,b,c   Stormer, H L ^a,b,c,d   Yakimenko, V ^a,b,c   Flynn, G ^a,b,c  

^a Och Spine at New York Presbyterian Hospitals   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c LUCENT TECHNOLOGIES   (United States)

^d NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EFFECTIVE MASS; ENERGETIC PROTONS; GRAPHENE; GRAPHENE SHEETS; MESOSCOPIC; SI SUBSTRATES; SINGLE LAYERS;

SILICON COMPOUNDS;

MASS TRANSFER;

GRAPHITE; NANOMATERIAL;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; GAS; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; GASES; GRAPHITE; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; MICROSCOPY, ELECTRON, SCANNING; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTIES;

EID: 61649087958     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl803087x     Document Type: Article

References (42)

1. Bolotin, K. I.; Sikes, K. J.; Jiang, Z.; Klima, M.; Fudenberg, G.; Hone, J.; Kim, P.; Stormer, H. L. Solid State Commun. 2008, 146 (9-10), 351-355.
2. Geim, A. K.; Novoselov, K. S. Nat. Mater. 2007, 6 (3), 183-191.
3. Han, M. Y.; Ozyilmaz, B.; Zhang, Y. B.; Kim, P. Phys. Reυ. Lett. 2007, 98 (20), 206805.
4. Heersche, H. B.; Jarillo-Herrero, P.; Oostinga, J. B.; Vandersypen, L. M. K.; Morpurgo, A. F. Nature 2007, 446 (7131), 56-59.
5. Novoselov, K. S.; Geim, A. K.; Morozov, S. V.; Jiang, D.; Zhang, Y.; Dubonos, S. V.; Grigorieva, I. V.; Firsov, A. A. Science 2004,306 (5696), 666-669.
6. Du, X.; Skachko, I.; Barker, A.; Andrei, E. Y. Nat. Nanotechnol. 2008,3 (8), 491-495.
7. Bunch, J. S.; van der Zande, A. M.; Verbridge, S. S.; Frank, I. W.; Tanenbaum, D. M.; Parpia, J. M.; Craighead, H. G.; McEuen, P. L. Science 2007, 315 (5811), 490-493.
8. Lee, C; Wei, X.; Kysar, J. W.; Hone, J. Science 2008, 321 (5887), 385-388.
9. Striemer, C. C; Gaborski, T. R.; McGrath, J. L.; Fauchet, P. M. Nature 2007, 445 (7129), 749-753.
10. Frank, I. W.; Tanenbaum, D. M.; van der Zande, A. M.; McEuen, P. L. AVS 2007, 25, 2558-2561.
11. Liu, L.; Ryu, S.; Tomasik, M. R.; Stolyarova, E.; Jung, N.; Hybertsen, M. S.; Steigerwald, M. L.; Brus, L. E.; Flynn, G. W. Nano Lett. 2008,8 (7), 1965.
12. Schedin, F.; Geim, A. K.; Morozov, S. V.; HUI, E. W.; Blake, P.; Katsnelson, M. I.; Novoselov, K. S. Nat. Moter. 2007, 6 (9), 652-655.
13. Novoselov, K. S.; Jiang, D.; Schedin, F.; Booth, T. J.; Khotkevich, V. V.; Morozov, S. V.; Geim, A. K. Proc. Natl. Acad. Sci. U.S.A. 2005, 102 (30), 10451-10453.
14. Ferran, A. C; Meyer, J. G; Scardaci, V.; Casiraghi, C; Lazzeri, M.; Mauri, F.; Piscanec, S.; Jiang, D.; Novoselov, K. S.; Roth, S.; Geim, A. K. Phys. Reυ. Lett. 2006, 97 (18), 187401.
15. Gupta, A.; Chen, G.; Joshi, P.; Tadigadapa, S.; Eklund, P. C. Nano Lett. 2006, 6 (12), 2667-2673.
16. Ferran, A. C. Solid State Commun. 2007, 143 (1-2), 47-57.
17. Alaca, B. E.; Selby, J. C; Saif, M. T. A.; Sehitoglu, H. Reυ. Sci. Instrum. 2002, 73 (8), 2963-2970.
18. Sabio, J.; Seoanez, C; Fratini, S.; Guinea, F.; Neto, A. H. C; Sols, F. Phys. Reυ. B 2008, 77 (19), 195409-8.
19. Ishigami, M.; Chen, J. H.; Cullen, W. G.; Fuhrer, M. S.; Williams, E. D. Nano Lett. 2007, 7 (6), 1643-1648.
20. Stolyarova, E.; Rim, K. T.; Ryu, S.; Maultzsch, J.; Kim, P.; Brus, L. E.; Heinz, T. F.; Hybertsen, M. S.; Flynn, G. W. Proc. Natl. Acad. Sci. U.S.A. 2007, 104 (22), 9209-9212.
21. Stolyarova, E.; Stolyarov, D.; Liu, L.; Rim, K. T.; Zhang, Y.; Han, M.; Hybersten, M.; Kim, P.; Flynn, G. J. Phys. Chem. C 2008, 112 (17), 6681-6688.
22. Guseva, M.; Martynenko, Y. Soυ. Phys. Usp. 1981, 24 (12), 996.
23. Barzola-Quiquia, J.; Esquinazi, P.; Rothermel, M.; Spemann, D.; Butz, T.; Garcia, N. Phys. Reυ. B 2007, 76 (16), 161403-4.
24. Ohldag, H.; Tyliszczak, T.; Hohne, R.; Spemann, D.; Esquinazi, P.; Ungureanu, M.; Butz, T. Phys. Reυ. Lett. 2007, 98 (18), 187204-4.
25. http://www.srim.org/.
26. Spemann, D.; Esquinazi, P.; Höhne, R.; Setzer, A.; Diaconu, M.; Schmidt, H.; Butz, T. Nucl Instrum. Methods Phys. Res., Sect. B 2005,231 (1-4), 433-439.
27. See Supporting Information.
28. Kozlovski, V. Radiation Defect Engineering; World Scientific Publish- ing Co.: Singapore, 2005.
29. Hosono, H.; Matsunami, N. Nucl. Instrum. Methods Phys. Res., Sect. B 1998, 141 (1-4), 566-574.
30. Krasheninnikov, A. V.; Banhart, F. Nat. Mater. 2007, 6 (10), 723-733.
31. Fitting, H. J.; Schreiber, E.; Glavatskikh, I. A. Microsc. Microanal. 2004, 10 (06), 764-770.
32. Hosono, H.; Kawazoe, H.; Matsunami, N. Phys. Reυ. Lett. 1998, 80 (2), 317.
33. Lanzillotto, A.-M.; Madey, T. E.; Baragiola, R. A. Phys. Reυ. Lett. 1991, 67 (2), 232.
34. Petravić, M. Phys. Reυ. B 1993, 48 (4), 2627.
35. Zhuravlev, L. T. Colloids Surf., A 2000, 173 (1-3), 1-38.
36. Kim, W.; Javey, A.; Vermesh, O.; Wang, Q.; Li, Y.; Dai, H. Nano Lett. 2003, 3 (2), 193-198.
37. Properties of Crystalline Silicon, 4th ed.; Hull, R., Ed.; INSPEC: London, 1999.
38. Waqar, Z. /. Moter. Sci. 2007, 42 (4), 1169-1176.
39. Patchkovskii, S.; Tse, J. S.; Yurchenko, S. N.; Zhechkov, L.; Heine, T.; Seifert, G. Proc. Natl. Acad. Sci. U.S.A. 2005, 102 (30), 10439-10444.
40. Larminie, J.; Dicks, A., Fuel Cell Systems Explained. 2 ed.; Wiley: New York, 2003.
41. Whitesides, G. M. Nature 2006, 442 (7101), 368-373.
42. Mizes, H. A.; Foster, J. S. Science 1989, 244, 559-562.