At-speed transition fault testing with low speed scan enable

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2005, Pages 42-47

  Ahmed, Nisar ^a   Ravikumar, C P ^a   Tehranipoor, Mohammad ^b   Plusquellic, Jim ^b  

^a TEXAS INSTRUMENTS   (India)

^b University of Marylandw Baltimore County   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AT-SPEED TEST; CONTROL INFORMATION; GIGAHERTZ RANGE; INDUSTRIAL FLOWS; LAUNCH-OFF-SHIFT; SCAN OPERATIONS; TRANSITION FAULTS; WORKING FREQUENCY;

ELECTRICAL ENGINEERING;

INTEGRATED CIRCUIT TESTING;

EID: 84886522267     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2005.31     Document Type: Conference Paper

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