Hybrid delay scan: A low hardware overhead scan-based delay test technique for high fault coverage and compact test sets

Proceedings - Design, Automation and Test in Europe Conference and Exhibition

Volumn 2, Issue , 2004, Pages 1296-1301

  Wang, Seongmoon ^a   Liu, Xiao ^b   Chakradhar, Srimat T ^a  

^a NEC LABORATORIES AMERICA   (United States)

^b VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPACT TEST SETS; DELAY TESTING; FAULT COVERAGES; HYBRID DELAY SCAN; BENCHMARK CIRCUIT; FAST SWITCHING; HARDWARE OVERHEADS; HYBRID APPROACH; HYBRID DELAYS; TRANSITION DELAY FAULTS;

AUTOMATIC TESTING; BENCHMARKING; FAULT TOLERANT COMPUTER SYSTEMS; FLIP FLOP CIRCUITS; SWITCHING; TREES (MATHEMATICS); DESIGN; EXHIBITIONS; TESTING;

COMPUTER HARDWARE; HARDWARE;

EID: 3042845426     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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