Nanoscale infrared spectroscopy

Materials Today

Volumn 13, Issue 11, 2010, Pages 56-60

  Prater, Craig ^a   Kjoller, Kevin ^a   Shetty, Roshan ^a  

^a Anasys Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL CHARACTERIZATION; ENABLING TECHNIQUES; NANO SCALE; PHYSICAL MEASUREMENT; SPATIALLY RESOLVED; TOPOGRAPHY IMAGING;

INFRARED SPECTROSCOPY; NANOSTRUCTURED MATERIALS;

SCANNING PROBE MICROSCOPY;

EID: 78049328282     PISSN: 13697021     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-7021(10)70205-4     Document Type: Article

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