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Volumn , Issue , 2013, Pages 689-694

Reliability-driven task mapping for lifetime extension of networks-on-chip based multiprocessor systems

Author keywords

[No Author keywords available]

Indexed keywords

CONVEX OPTIMIZATION; DATA FLOW ANALYSIS; DIRECTED GRAPHS; EMBEDDED SYSTEMS; MAPPING; NETWORK-ON-CHIP; RELIABILITY; VOLTAGE SCALING;

EID: 84885587788     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.7873/date.2013.149     Document Type: Conference Paper
Times cited : (64)

References (17)
  • 1
    • 0141837018 scopus 로고    scopus 로고
    • Trends and challenges in VLSI circuit reliability
    • C. Constantinescu, "Trends and challenges in VLSI circuit reliability," IEEE Micro, 2003.
    • (2003) IEEE Micro
    • Constantinescu, C.1
  • 8
    • 77953114464 scopus 로고    scopus 로고
    • Age sim: A simulation framework for evaluating the lifetime reliability of processor-based SoCs
    • L. Huang et al, "Age Sim: a simulation framework for evaluating the lifetime reliability of processor-based SoCs," in IEEE Conference on Design, Automation and Test in Europe (DATE), 2010.
    • (2010) IEEE Conference on Design, Automation and Test in Europe (DATE)
    • Huang, L.1
  • 12
    • 85085783303 scopus 로고    scopus 로고
    • Thermal-aware system analysis and software synthesis for embedded multi-processors
    • L. Thiele et al, "Thermal-aware system analysis and software synthesis for embedded multi-processors," in ACM Design Automation Conference (DAC), 2011.
    • (2011) ACM Design Automation Conference (DAC)
    • Thiele, L.1
  • 13
    • 84893381946 scopus 로고    scopus 로고
    • Failure mechanisms and models for semiconductor devices
    • J. S. S. T. Association et al
    • J. S. S. T. Association et al, "Failure mechanisms and models for semiconductor devices," JEDEC Publication JEP122-B, 2003.
    • (2003) JEDEC Publication JEP122-B


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.