Gas sensing properties of pulsed laser deposited vanadium oxide thin films with various crystal structures

Sensors and Actuators, B: Chemical

Volumn 187, Issue , 2013, Pages 386-394

  Huotari, J ^a   Lappalainen, J ^a   Puustinen, J ^a   Lloyd Spetz, A ^a,b  

^a UNIVERSITY OF OULU   (Finland)

^b LINKÖPING UNIVERSITY   (Sweden)

Author keywords

Gas sensing; Resistivity change; Thin film; Vanadium oxides

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL DETECTION; CRYSTAL STRUCTURE; CRYSTAL SYMMETRY; DEPOSITION; GAS DETECTORS; GAS SENSING ELECTRODES; GASES; LIGHT TRANSMISSION; OXIDE FILMS; OXIDES; PULSED LASER DEPOSITION; PULSED LASERS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR LASERS; VANADIUM; VANADIUM COMPOUNDS; X RAY DIFFRACTION; YARN;

BACKGROUND ENVIRONMENT; CRYSTAL STRUCTURE AND SYMMETRY; GAS SENSING; OPTICAL TRANSMISSION SPECTRUM; RESISTIVITY CHANGES; RESISTIVITY MEASUREMENT; VANADIUM OXIDE THIN FILMS; VANADIUM OXIDES;

THIN FILMS;

EID: 84885479036     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2012.12.067     Document Type: Article

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