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Thin Solid Films

Volumn 349, Issue 1-2, 1999, Pages 254-259

A study of physical properties and gas-surface interaction of vanadium oxide thin films

(8) Rella, R a Siciliano, P a Cricenti, A b Generosi, R b Girasole, M b Vanzetti, L c Anderle, M c Coluzza, C d

a CNR (Italy)

b CNR (Italy)

c CMBM (Italy)

d UNIVERSITÀ DI ROMA LA SAPIENZA (Italy)

Author keywords

Sensors; Sputtering; Surface composition; Vanadium oxide

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL SENSORS; FILM PREPARATION; MAGNETRON SPUTTERING; MORPHOLOGY; PHYSICAL PROPERTIES; VANADIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

GAS-SURFACE INTERACTION; VANADIUM OXIDE;

THIN FILMS;

EID: 0032644284 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(99)00142-X Document Type: Article

Times cited : (26)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.