Nature of the metal insulator transition in ultrathin epitaxial vanadium dioxide

Nano Letters

Volumn 13, Issue 10, 2013, Pages 4857-4861

  Quackenbush, N F ^a   Tashman, J W ^b   Mundy, J A ^b   Sallis, S ^c   Paik, H ^b   Misra, R ^d   Moyer, J A ^e   Guo, J H ^f   Fischer, D A ^g   Woicik, J C ^g   Muller, D A ^b   Schlom, D G ^b   Piper, L F J ^a,c  

^a BINGHAMTON UNIVERSITY   (United States)

^b School of Operations Research and Industrial Engineering   (United States)

^c State University of New York   (United States)

^d PENNSYLVANIA STATE UNIVERSITY   (United States)

^e University of Illinois at Urbana Champaign   (United States)

^f LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^g NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

metal insulator transition; transition metal oxides; ultrathin films; X ray spectroscopy

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRONIC STRUCTURE; ENERGY DISSIPATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; METAL INSULATOR BOUNDARIES; OXIDE MINERALS; POINT CONTACTS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR INSULATOR BOUNDARIES; SUBSTRATES; TITANIUM DIOXIDE; TRANSITION METAL OXIDES; TRANSITION METALS; ULTRATHIN FILMS; VANADIUM DIOXIDE; X RAY ABSORPTION SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SPECTROSCOPY; X RAYS;

BULK COUNTERPART; END POINTS; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; RESISTANCE CHANGE; RESISTIVITY MEASUREMENT; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STRAIN-INDUCED CHANGE; ULTRA-THIN;

METAL INSULATOR TRANSITION;

METAL; OXIDE; VANADIUM DERIVATIVE; VANADIUM DIOXIDE;

ARTICLE; CHEMISTRY; ELECTRIC CONDUCTIVITY; PHASE TRANSITION; SURFACE PROPERTY; X RAY ABSORPTION SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRIC CONDUCTIVITY; METALS; OXIDES; PHASE TRANSITION; PHOTOELECTRON SPECTROSCOPY; SURFACE PROPERTIES; VANADIUM COMPOUNDS; X-RAY ABSORPTION SPECTROSCOPY;

EID: 84885460501     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl402716d     Document Type: Article

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