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Journal of Applied Physics

Volumn 109, Issue 4, 2011, Pages

Spectroscopic evidence of the formation of (V,Ti)O2 solid solution in VO2 thinner films grown on TiO2(001) substrates

(7) Muraoka, Y a Saeki, K a Eguchi, R a,b Wakita, T a Hirai, M a Yokoya, T a Shin, S b

a OKAYAMA UNIVERSITY (Japan)

b RIKEN SPring 8 Center (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL STATE; CORE-LEVEL PHOTOEMISSION; DIRAC POINT; EPITAXIALLY GROWN; GROWTH MODELS; IN-SITU; IN-SITU SYNCHROTRONS; INSULATOR PHASE; KEY ISSUES; RESISTIVITY MEASUREMENT; SHARP INTERFACE; SPECTROSCOPIC EVIDENCE; TEMPERATURE-INDUCED; THREE ORDERS OF MAGNITUDE; TIO; TRANSITION TEMPERATURE; TWO-STATE;

ELECTRONIC STATES; EMISSION SPECTROSCOPY; IONS; METAL INSULATOR BOUNDARIES; PHOTOEMISSION; PULSED LASER DEPOSITION; SEMICONDUCTOR INSULATOR BOUNDARIES; SOLID SOLUTIONS; SOLIDIFICATION; SUBSTRATES; THICK FILMS; TRANSPORT PROPERTIES; ULTRATHIN FILMS; VAPOR DEPOSITION;

METAL INSULATOR TRANSITION;

EID: 79952121276 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3549835 Document Type: Article

Times cited : (28)

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