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Volumn 258, Issue 9, 2012, Pages 4129-4134

Pit formation on the Ge (1 0 0) surfaces by normal incident Si - ion implantation

Author keywords

Ge; Morphology; Pit formation; Si ion implantation; Simulation

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; CONTINUUM MECHANICS; ENERGY DISPERSIVE X RAY ANALYSIS; GERMANIUM; ION BEAMS; ION IMPLANTATION; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY;

EID: 84857063404     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.08.092     Document Type: Conference Paper
Times cited : (11)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.