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Volumn 258, Issue 9, 2012, Pages 4129-4134
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Pit formation on the Ge (1 0 0) surfaces by normal incident Si - ion implantation
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Author keywords
Ge; Morphology; Pit formation; Si ion implantation; Simulation
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHEMICAL ANALYSIS;
CONTINUUM MECHANICS;
ENERGY DISPERSIVE X RAY ANALYSIS;
GERMANIUM;
ION BEAMS;
ION IMPLANTATION;
MORPHOLOGY;
SCANNING ELECTRON MICROSCOPY;
CHEMICAL INFORMATION;
CIRCULAR STRUCTURES;
CONTINUUM MODELING;
EROSION MECHANISMS;
PIT FORMATION;
SI ION IMPLANTATIONS;
SIMULATION;
SMALL SLOPE APPROXIMATION;
ION BOMBARDMENT;
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EID: 84857063404
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2011.08.092 Document Type: Conference Paper |
Times cited : (11)
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References (30)
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