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Volumn 49, Issue 20, 2013, Pages 1283-1285
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High reliability sensing circuit for deep submicron spin transfer torque magnetic random access memory
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Author keywords
[No Author keywords available]
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Indexed keywords
HIGH RELIABILITY;
MAGNETIC RANDOM ACCESS MEMORY;
MAGNETIC TUNNEL JUNCTION;
PROCESS VARIATION;
SENSING CIRCUITS;
SENSING PERFORMANCE;
SPIN TRANSFER TORQUE;
STMICROELECTRONICS;
MAGNETIC STORAGE;
MONTE CARLO METHODS;
MAGNETIC DEVICES;
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EID: 84884863463
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el.2013.2319 Document Type: Article |
Times cited : (49)
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References (7)
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