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Volumn 63, Issue , 2013, Pages 228-239

Preparation and characterization of nanostructures of in-doped ZnO films deposited by chemically spray pyrolysis: Effect of substrate temperatures

(9) Benhaliliba, M a Benouis, C E a Mouffak, Z b Ocak, Y S c Tiburcio Silver, A d Aida, M S e Garcia, A A f Tavira, A f Sanchez Juarez, A g

a UNIVERSITÉ DES SCIENCES ET DE LA TECHNOLOGIE D ORAN MOHAMED BOUDIAF (Algeria)

b CALIFORNIA STATE UNIVERSITY (United States)

c DICLE UNIVERSITY (Turkey)

d ITT DIE (Mexico)

e Universite Mentouri Constantine (Algeria)

f DEPARTAMENTO DE FÍSICA (Mexico)

g INSTITUTO DE ENERGÍAS RENOVABLES (Mexico)

Author keywords

AFM analysis; Hall effect measurement; Indium doping; IZO; Photoluminescence emission; Spray pyrolysis; Substrate temperature; XRD pattern; ZnO

Indexed keywords

AFM ANALYSIS; HALL EFFECT MEASUREMENT; INDIUM DOPING; IZO; PHOTOLUMINESCENCE EMISSION; SUBSTRATE TEMPERATURE; XRD PATTERNS; ZNO;

ELECTRIC PROPERTIES; INDIUM; NANOSTRUCTURES; PHOTOLUMINESCENCE; SPRAY PYROLYSIS; SUBSTRATES; ULTRASONIC TESTING; ZINC OXIDE;

SEMICONDUCTOR DOPING;

EID: 84884852303 PISSN: 07496036 EISSN: 10963677 Source Type: Journal
DOI: 10.1016/j.spmi.2013.09.010 Document Type: Article

Times cited : (25)

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