Uncertainty in photoconductance measurements of the emitter saturation current

IEEE Journal of Photovoltaics

Volumn 3, Issue 4, 2013, Pages 1200-1207

  Thomson, Andrew F ^a   Hameiri, Ziv ^b   Grant, Nicholas E ^a   Price, Chris J ^c   Di, Yan ^a   Spurgin, Jack ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^c University of Christchurch   (New Zealand)

Author keywords

Photovoltaics; recombination; silicon

Indexed keywords

EMITTER SATURATION CURRENT DENSITY; EMITTER SATURATION CURRENTS; GENERATION UNCERTAINTY; MEASURED VOLTAGES; PHOTOVOLTAICS; QUASI-STEADY STATE; RECOMBINATION; TRANSIENT MEASUREMENT;

EQUIPMENT TESTING; MONTE CARLO METHODS; SILICON; SILICON WAFERS;

UNCERTAINTY ANALYSIS;

EID: 84884636196     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2013.2270346     Document Type: Article

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