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Volumn , Issue , 2012, Pages 848-853

Impact of interface recombination on time resolved photoluminescence (TRPL) decays in CdTe solar cells (numerical simulation analysis)

Author keywords

carrier lifetime; CdTe; interface recombination; numerical simulations

Indexed keywords

CDTE; CDTE SOLAR CELLS; CHARACTERIZATION METHODS; DEFECT CHARACTERIZATION; DEPOSITION PROCESS; INTERFACE RECOMBINATION; MODELING ANALYSIS; RECOMBINATION LOSS; THIN-FILM SOLAR CELLS; TIME-RESOLVED PHOTOLUMINESCENCE; TWO DIFFERENT WAVELENGTHS; TWO WAVELENGTH;

EID: 84869387777     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2012.6317736     Document Type: Conference Paper
Times cited : (26)

References (10)
  • 1
    • 41749104609 scopus 로고    scopus 로고
    • Characterizing recombination in CdTe solar cells with time-resolved photoluminescence
    • Waikoloa, HI
    • W.K. Metzger, M.J. Romero, P. Dippo, and M. Young, "Characterizing recombination in CdTe solar cells with time-resolved photoluminescence," in WCPEC-4 (Waikoloa, HI, 2006).
    • (2006) WCPEC-4
    • Metzger, W.K.1    Romero, M.J.2    Dippo, P.3    Young, M.4
  • 7
    • 58949098288 scopus 로고    scopus 로고
    • Dependence of carrier lifetime on cu-contacting temperature and ZnTe: Cu thickness in CdS/CdTe thin film solar cells
    • T.A. Gessert, W.K. Metzger, P. Dippo, S. E. Asher, R. G. Dhere, and M.R. Young, "Dependence of carrier lifetime on Cu-contacting temperature and ZnTe: Cu thickness in CdS/CdTe thin film solar cells," Thin Solid Films 517, 2370-2373 (2009).
    • (2009) Thin Solid Films , vol.517 , pp. 2370-2373
    • Gessert, T.A.1    Metzger, W.K.2    Dippo, P.3    Asher, S.E.4    Dhere, R.G.5    Young, M.R.6
  • 9
    • 84870647318 scopus 로고    scopus 로고
    • release A-2008.09, Zurich, Switzerland
    • "Synopsys, TCAD SDEVICE Manual, Release A-2008.09, Zurich, Switzerland, www.synopsys.com.,"
    • Synopsys, TCAD SDEVICE manual
  • 10
    • 84869400345 scopus 로고    scopus 로고
    • ASTM standard G173-03
    • West Conshohocken, PA, DOI: 10.1520/G0173-03E01
    • "ASTM Standard G173-03," in ASTM International, West Conshohocken, PA, DOI: 10.1520/G0173-03E01 (2008).
    • (2008) ASTM International


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.