Contrast and Raman spectroscopy study of single-and few-layered charge density wave material: 2H-TaSe2

Scientific Reports

Volumn 3, Issue , 2013, Pages

  Hajiyev, Parviz ^a   Cong, Chunxiao ^b   Qiu, Caiyu ^b   Yu, Ting ^a,b,c  

^a National University of Singapore   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^c NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

METAL NANOPARTICLE; SELENIUM; TANTALUM;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; ELECTRON TRANSPORT; MATERIALS TESTING; METHODOLOGY; RAMAN SPECTROMETRY; STATIC ELECTRICITY; ULTRASTRUCTURE; PROCEDURES;

CRYSTALLIZATION; ELECTRON TRANSPORT; MATERIALS TESTING; METAL NANOPARTICLES; SELENIUM; SPECTRUM ANALYSIS, RAMAN; STATIC ELECTRICITY; TANTALUM;

EID: 84883822261     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep02593     Document Type: Article

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