A model to predict image formation in atom probe tomography

Ultramicroscopy

Volumn 132, Issue , 2013, Pages 152-157

  Vurpillot, F ^a   Gaillard, A ^a   Da Costa, G ^a   Deconihout, B ^a  

^a UNIVERSITÉ DE ROUEN   (France)

Author keywords

Atom Probe Tomography; Dielectric; Image reconstruction; Modelisation

Indexed keywords

ATOM PROBE TOMOGRAPHY; CYLINDRICAL SYMMETRY; DIELECTRIC PERMITTIVITIES; MODELISATION; REALISTIC MODELLING; RECONSTRUCTION ARTEFACTS; RESIDUAL CONDUCTIVITY; THREE DIMENSIONAL GEOMETRY;

EVAPORATION; IMAGE RECONSTRUCTION; PERMITTIVITY;

DIELECTRIC MATERIALS;

ARTICLE; ARTIFACT; ATOM PROBE TOMOGRAPHY; CONDUCTANCE; DIELECTRIC CONSTANT; ELECTRIC POTENTIAL; EVAPORATION; IMAGE ANALYSIS; IMAGE DISPLAY; IMAGE RECONSTRUCTION; MATHEMATICAL MODEL; MICROSCOPE; PREDICTION; THREE DIMENSIONAL IMAGING; TOMOGRAPHY;

EID: 84883794918     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.12.007     Document Type: Article

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