Valence electron energy-loss spectroscopy study of ZrSiO4 and ZrO2

Ultramicroscopy

Volumn 134, Issue , 2013, Pages 68-76

  Jiang, Nan ^a   Spence, John C H ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Dielectric function; Energy loss spectroscopy; Kramers Kronig; Valence electrons; VEELS; Zirconia

Indexed keywords

DIELECTRIC FUNCTIONS; ENERGY-LOSS SPECTROSCOPY; KRAMERS-KRONIG; VALENCE ELECTRON; VEELS;

ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; PLASMONS; SEMICONDUCTOR QUANTUM WELLS; SILICATE MINERALS; ZIRCONIA;

ZIRCONIUM ALLOYS;

ZIRCONIUM; ZIRCONIUM OXIDE;

ANALYTIC METHOD; ARTICLE; BANDGAP ENERGY; CHEMICAL COMPOSITION; CHEMICAL PARAMETERS; CHEMICAL STRUCTURE; DIELECTRIC RESPONSE FUNCTION; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY; KRAMERS KRONIG ANALYSIS; SINGLE ELECTRON INTERBAND TRANSITION SPECTRA; THICKNESS; VALENCE ELECTRON ENERGY LOSS SPECTROSCOPY;

DIELECTRIC FUNCTION; ENERGY-LOSS SPECTROSCOPY; KRAMERS-KRONIG; VALENCE ELECTRONS; VEELS; ZIRCONIA;

SILICATES; SPECTROSCOPY, ELECTRON ENERGY-LOSS; ZIRCONIUM;

EID: 84883556264     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.06.021     Document Type: Article

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