Separation of bulk and surface-losses in low-loss EELS measurements in STEM

Ultramicroscopy

Volumn 107, Issue 4-5, 2007, Pages 345-355

  Mkhoyan, K A ^a   Babinec, T ^a,b   Maccagnano, S E ^a   Kirkland, E J ^a   Silcox, J ^a  

^a Cornell University   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Bulk plasmon loss; Dielectric function; EELS; Si; STEM; Surface loss

Indexed keywords

DIELECTRIC PROPERTIES; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; SILICON; SURFACE PLASMON RESONANCE;

BULK PLASMON LOSS; DIELECTRIC FUNCTION; STEM; SURFACE LOSS;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 33846347543     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.09.003     Document Type: Article

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