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Volumn 60, Issue 9, 2013, Pages 2311-2320

Compressive self-powering of piezo-floating-gate mechanical impact detectors

Author keywords

Compressive powering; floating gate transistor; mechanical impact detection; piezoelectricity; self powered sensors; strain; structural health monitoring

Indexed keywords

CRYSTALLOGRAPHY; DYNAMIC LOADS; PIEZOELECTRICITY; STRAIN;

EID: 84883465945     PISSN: 15498328     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2013.2245472     Document Type: Article
Times cited : (10)

References (20)
  • 1
    • 84856455418 scopus 로고    scopus 로고
    • An asynchronous analog self-powered cmos sensor-data-logger with a 13.56 mhz rf programming inter face
    • Feb.
    • C. Huang and S. Chakrabartty, "An asynchronous analog self-powered CMOS sensor-data-logger with a 13.56 MHz RF programming inter face, " IEEE J. Solid-State Circuits, vol. 47, no. 2, pp. 476-489, Feb. 2012.
    • (2012) IEEE J. Solid-State Circuits , vol.47 , Issue.2 , pp. 476-489
    • Huang, C.1    Chakrabartty, S.2
  • 2
    • 0032074435 scopus 로고    scopus 로고
    • Self-powered signal processing using vibration-based power generation
    • PII S0018920098022318
    • R. Amirtharajah and A. P. Chandrakasan, "Self-powered signal processing using vibration-based power generation, " IEEE J. Solid-State Circuits, vol. 33, no. 5, pp. 687-695, May 1998. (Pubitemid 128573473)
    • (1998) IEEE Journal of Solid-State Circuits , vol.33 , Issue.5 , pp. 687-695
    • Amirtharajah, R.1    Chandrakasan, A.P.2
  • 3
    • 78650859161 scopus 로고    scopus 로고
    • A battery-less thermoelectric energy harvesting interface circuit with 35 mv startup voltage
    • Jan.
    • Y. K. Ramadass and A. P. Chandrakasan, "A battery-less thermoelectric energy harvesting interface circuit with 35 mV startup voltage, " IEEE J. Solid-State Circuits, vol. 46, no. 1, pp. 333-341, Jan. 2011.
    • (2011) IEEE J. Solid-State Circuits , vol.46 , Issue.1 , pp. 333-341
    • Ramadass, Y.K.1    Chandrakasan, A.P.2
  • 5
    • 77949386822 scopus 로고    scopus 로고
    • Cambridge, U.K.: Cambridge Univ. Press
    • S. Suresh, Fatigue of Materials, 2nd ed. Cambridge, U.K.: Cambridge Univ. Press, 1998, 10: 0521578477.
    • (1998) Fatigue of Materials, 2nd Ed , vol.10 , pp. 0521578477
    • Suresh, S.1
  • 6
    • 84883465082 scopus 로고    scopus 로고
    • Bullet impact on steel and kevlar/steel armor-computer modelling and experimental data
    • D. S. Peerce and V. S. Berg, "Bullet impact on steel and kevlar/steel armor-computer modelling and experimental data, " in Proc. ASME Conf. Proc., 2004, vol. 207.
    • (2004) Proc. ASME Conf. Proc. , vol.207
    • Peerce, D.S.1    Berg, V.S.2
  • 7
    • 0035342064 scopus 로고    scopus 로고
    • Dynamic mechanical properties of polycrystalline graphites and a 2D-C/C composite by plate impact
    • DOI 10.1016/S0734-743X(00)00057-9, PII S0734743X00000579
    • K. Fujii, E. Yasuda, and Y. Tanabe, "Dynamic mechanical properties of polycrystalline graphites and a 2D-C/C composite by plate impact, " Int. J. Impact Eng., vol. 25, no. 5, pp. 473-491, May 2001. (Pubitemid 32272876)
    • (2001) International Journal of Impact Engineering , vol.25 , Issue.5 , pp. 473-491
    • Fujii, K.1    Yasuda, E.2    Tanabe, Y.3
  • 8
    • 77951667409 scopus 로고    scopus 로고
    • A comparative investigation of the use of laminate-level meso-scale and fracture-mechanics-enriched meso-scale composite-material models in ballistic-resistance analyses
    • M. Grujicic, T. He, H. Marvi, B. A. Cheeseman, and C. F. Yen, "A comparative investigation of the use of laminate-level meso-scale and fracture-mechanics-enriched meso-scale composite-material models in ballistic-resistance analyses, " J. Mater. Sci., vol. 45, no. 12, pp. 3136-3150.
    • J. Mater. Sci , vol.45 , Issue.12 , pp. 3136-3150
    • Grujicic, M.1    He, T.2    Marvi, H.3    Cheeseman, B.A.4    Yen, C.F.5
  • 9
    • 77949360212 scopus 로고    scopus 로고
    • Calibration and characterization of self-powered floating-gate usage monitor with single electron per second operational limit
    • Mar.
    • C. Huang, N. Lajnef, and S. Chakrabartty, "Calibration and characterization of self-powered floating-gate usage monitor with single electron per second operational limit, " IEEE Trans. Circuits Syst. I: Reg. Papers, vol. 57, no. 3, pp. 556-567, Mar. 2010.
    • (2010) IEEE Trans. Circuits Syst. I: Reg. Papers , vol.57 , Issue.3 , pp. 556-567
    • Huang, C.1    Lajnef, N.2    Chakrabartty, S.3
  • 10
    • 80255138084 scopus 로고    scopus 로고
    • Rail-to-rail, linear hot-electron injection programming of floating-gate voltage bias generators at 13-bit resolution
    • Nov.
    • C. Huang, P. Sarkar, and S. Chakrabartty, "Rail-to-rail, linear hot-electron injection programming of floating-gate voltage bias generators at 13-bit resolution, " IEEE J. Solid-State Circuits, vol. 46, no. 11, pp. 2685-2962, Nov. 2011.
    • (2011) IEEE J. Solid-State Circuits , vol.46 , Issue.11 , pp. 2685-2962
    • Huang, C.1    Sarkar, P.2    Chakrabartty, S.3
  • 11
    • 84883447926 scopus 로고    scopus 로고
    • An ultra-linear piezo-floating-gate strain-gauge for self-powered measurement of quasistatic-strain
    • to be published
    • P. Sarkar, C. Huang, and S. Chakrabartty, "An ultra-linear Piezo-floating-gate strain-gauge for self-powered measurement of quasistatic-strain, " IEEE Trans. Biomed. Circuits Syst., to be published.
    • IEEE Trans. Biomed. Circuits Syst
    • Sarkar, P.1    Huang, C.2    Chakrabartty, S.3
  • 12
    • 58049102028 scopus 로고    scopus 로고
    • A general equivalent circuit model for piezoelectric generators
    • Jan.
    • N. G. Elvin and A. A. Elvin, "A general equivalent circuit model for piezoelectric generators, " J. Intell. Syst. Structures, vol. 20, no. 1, pp. 3-9, Jan. 2009.
    • (2009) J. Intell. Syst. Structures , vol.20 , Issue.1 , pp. 3-9
    • Elvin, N.G.1    Elvin, A.A.2
  • 14
    • 34250719161 scopus 로고    scopus 로고
    • A high efficiency all-pmos charge pump for low-voltage operations
    • Hsinchu, Taiwan, Nov.
    • N. Yan and H. Min, "A high efficiency all-PMOS charge pump for low-voltage operations, " in Proc. IEEE Asian Solid-State Circuits Conf., Hsinchu, Taiwan, Nov. 2005, p. 361364.
    • (2005) Proc. IEEE Asian Solid-State Circuits Conf , pp. 361364
    • Yan, N.1    Min, H.2
  • 15
    • 0038718671 scopus 로고    scopus 로고
    • Power efficient charge pump in deep submicron standard cmos technology
    • Jun.
    • R. Pelliconi and D. Iezzi et al., "Power efficient charge pump in deep submicron standard CMOS technology, " IEEE J. Solid-State Circuits, vol. 38, no. 6, pp. 1068-1071, Jun. 2003.
    • (2003) IEEE J. Solid-State Circuits , vol.38 , Issue.6 , pp. 1068-1071
    • Pelliconi, R.1    Iezzi, D.2
  • 16
    • 0003535110 scopus 로고    scopus 로고
    • Ph.D. dissertation Dept. Comput. Neural Syst., California Inst. Technol., Pasadena, CA, USA
    • P. Hasler, "Foundations of Learning in Analog VLSI, " Ph.D. dissertation, Dept. Comput. Neural Syst., California Inst. Technol., Pasadena, CA, USA, 1997.
    • (1997) Foundations of Learning in Analog VLSI
    • Hasler, P.1
  • 17
    • 23144438334 scopus 로고    scopus 로고
    • A floating-gate comparator with automatic offset adaptation for 10-bit data conversion
    • DOI 10.1109/TCSI.2005.851389
    • Y. L. Wong, M. H. Cohen, and P. A. Abshire, "A floating-gate comparator with automatic offset adaptation for 10-bit data conversion, " IEEE Trans. Circuits Syst. I: Reg. Papers, vol. 52, no. 7, pp. 1316-1326, Jul. 2005. (Pubitemid 41081624)
    • (2005) IEEE Transactions on Circuits and Systems I: Regular Papers , vol.52 , Issue.7 , pp. 1316-1326
    • Wong, Y.L.1    Cohen, M.H.2    Abshire, P.A.3
  • 18
    • 33847706576 scopus 로고    scopus 로고
    • A precision CMOS amplifier using floating-gate transistors for offset cancellation
    • DOI 10.1109/JSSC.2006.889365
    • V. Srinivasan, G. J. Serrano, J. Gray, and P. Hasler, "A precision CMOS amplifier using floating-gate transistors for offset cancellation, " IEEE J. Solid-State Circuits, vol. 42, no. 2, pp. 280-291, Feb. 2007. (Pubitemid 46374513)
    • (2007) IEEE Journal of Solid-State Circuits , vol.42 , Issue.2 , pp. 280-291
    • Srinivasan, V.1    Serrano, G.J.2    Gray, J.3    Hasler, P.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.