Power efficient charge pump in deep submicron standard CMOS technology

IEEE Journal of Solid-State Circuits

Volumn 38, Issue 6, 2003, Pages 1068-1071

  Pelliconi, Roberto ^a   Iezzi, David ^a   Baroni, Andrea ^a   Pasotti, Marco ^a   Rolandi, Pier Luigi ^a  

^a STMICROELECTRONICS   (Italy)

Author keywords

Charge pump; CMOS; Deep submicron; Flash memory; Low voltage

Indexed keywords

FLASH MEMORY; MOSFET DEVICES; PROBLEM SOLVING;

CHARGE PUMPS;

CMOS INTEGRATED CIRCUITS;

EID: 0038718671     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2003.811991     Document Type: Article

References (7)

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