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Journal of Alloys and Compounds

Volumn 578, Issue , 2013, Pages 613-619

Properties of ZnO:Bi thin films prepared by spray pyrolysis technique

(4) Sadananda Kumar, N a Bangera, Kasturi V a Anandan, C b Shivakumar, G K a

a NATIONAL INSTITUTE OF TECHNOLOGY KARNATAKA (India)

b SURFACE ENGINEERING DIVISION (India)

Author keywords

Chemical synthesis; Crystal structure; Optical properties; Photoelectron spectroscopies; Semiconductors; Thin films

Indexed keywords

CRYSTAL STRUCTURE; DOPING (ADDITIVES); ENERGY GAP; METALLIC FILMS; OPTICAL FILMS; OPTICAL PROPERTIES; OXIDE FILMS; PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; PHOTONS; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DOPING; SEMICONDUCTOR MATERIALS; SPRAY PYROLYSIS; SUBSTRATES; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC; ZINC OXIDE; THIN FILMS;

DOPING CONCENTRATION; ELECTRICAL CONDUCTIVITY; GLASS SUBSTRATES; HEXAGONAL STRUCTURES; PREFERRED ORIENTATIONS; SCANNING ELECTRONS; SPRAY-PYROLYSIS TECHNIQUES; X-RAY DIFFRACTION STUDIES;

THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84882425178 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2013.07.036 Document Type: Article

Times cited : (29)

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