Critical shell thickness for InAs-AlxIn1-xAs(P) core-shell nanowires

Journal of Applied Physics

Volumn 112, Issue 12, 2012, Pages

  Haapamaki, C M ^a   Baugh, J ^b   Lapierre, R R ^a  

^a MCMASTER UNIVERSITY   (Canada)

^b UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; EDGE DISLOCATIONS; GALLIUM ARSENIDE; GAS SOURCE MOLECULAR BEAM EPITAXY; GOLD COMPOUNDS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; III-V SEMICONDUCTORS; INDIUM ARSENIDE; MOLECULAR BEAM EPITAXY; NANOWIRES; SHELLS (STRUCTURES); ZINC SULFIDE;

CORE-SHELL NANOWIRES; ENERGY CRITERION; GAAS SUBSTRATES; INAS NANOWIRES; SELECTED AREA DIFFRACTION PATTERNS; SHELL THICKNESS; STIFFNESS PARAMETERS; TENSOR TRANSFORMATION;

PHOSPHORUS COMPOUNDS;

EID: 84882249862     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4769735     Document Type: Article

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