-
1
-
-
0034670761
-
-
ANDREEV, A. D., and O'REILLY, E. P., 2000, Phys. Rev. B, 62, 15851.
-
(2000)
Phys. Rev. B
, vol.62
, pp. 15851
-
-
Andreev, A.D.1
O'Reilly, E.P.2
-
2
-
-
0030105576
-
-
BEANLAND, R., DUNSTAN, D. J., and GOODHEW, P. J., 1996, Adv. Phys., 45, 87.
-
(1996)
Adv. Phys.
, vol.45
, pp. 87
-
-
Beanland, R.1
Dunstan, D.J.2
Goodhew, P.J.3
-
3
-
-
79955982456
-
-
CHALDYSHEV, V. V., BERT, N. A., ROMANOV, A. E., SUVOROVA, A. A., KOLESNIKOVA, A. L., PREOBRAZHENSKII, V. V., PUTYATO, M. A., SEMYAGIN, B. R., WERNER, P., ZAKHAROV, N. D., and CLAVERIE, A., 2002, Appl. Phys. Lett., 80, 377.
-
(2002)
Appl. Phys. Lett.
, vol.80
, pp. 377
-
-
Chaldyshev, V.V.1
Bert, N.A.2
Romanov, A.E.3
Suvorova, A.A.4
Kolesnikova, A.L.5
Preobrazhenskii, V.V.6
Putyato, M.A.7
Semyagin, B.R.8
Werner, P.9
Zakharov, N.D.10
Claverie, A.11
-
4
-
-
0141746202
-
-
CHEN, X., Lou, Y., SAMIA, A. C., and BURDA, C., 2003, Nano Lett., 3, 799.
-
(2003)
Nano Lett.
, vol.3
, pp. 799
-
-
Chen, X.1
Lou, Y.2
Samia, A.C.3
Burda, C.4
-
5
-
-
0036507594
-
-
COLIN, J., and GRIHLE, J., 2002, Phil. Mag. Lett., 82, 125.
-
(2002)
Phil. Mag. Lett.
, vol.82
, pp. 125
-
-
Colin, J.1
Grihle, J.2
-
6
-
-
84983860629
-
-
DUNDURS, J., and SALAMON, N. J., 1972, J. Phys. C, 50, 125.
-
(1972)
J. Phys. C
, vol.50
, pp. 125
-
-
Dundurs, J.1
Salamon, N.J.2
-
7
-
-
0001551941
-
-
FENG, X., and HIRTH, J. P., 1992, J. appl. Phys., 72, 1386.
-
(1992)
J. Appl. Phys.
, vol.72
, pp. 1386
-
-
Feng, X.1
Hirth, J.P.2
-
8
-
-
0000729880
-
-
FRANK, F. C., and VAN DER MERVE, J. H., 1949a, Proc. R. Soc. A, 198, 205; 1949b, ibid., 198, 216.
-
(1949)
Proc. R. Soc. A
, vol.198
, pp. 205
-
-
Frank, F.C.1
Van Der Merve, J.H.2
-
9
-
-
0000440628
-
-
FRANK, F. C., and VAN DER MERVE, J. H., 1949a, Proc. R. Soc. A, 198, 205; 1949b, ibid., 198, 216.
-
(1949)
Proc. R. Soc. A
, vol.198
, pp. 216
-
-
-
11
-
-
0142159473
-
-
Cambridge: Cambridge University Press
-
FREUND, L. B., and SURESH, S., 2003, Thin Film Materials: Stress, Defect Formation and Surface Evolution (Cambridge: Cambridge University Press), p. 750.
-
(2003)
Thin Film Materials: Stress, Defect Formation and Surface Evolution
, pp. 750
-
-
Freund, L.B.1
Suresh, S.2
-
12
-
-
0029779431
-
-
GOSLING, T. J., and FREUND, L. B., 1996, Acta mater., 44, 1.
-
(1996)
Acta Mater.
, vol.44
, pp. 1
-
-
Gosling, T.J.1
Freund, L.B.2
-
13
-
-
0038170527
-
-
GUTKIN, M. Y., OVID'KO, I. A., and SHEINERMAN, A. G., 2003, J. Phys.: Condensed Matter, 15, 3539.
-
(2003)
J. Phys.: Condensed Matter
, vol.15
, pp. 3539
-
-
Gutkin, M.Y.1
Ovid'ko, I.A.2
Sheinerman, A.G.3
-
14
-
-
84990631054
-
-
GUTKIN, M. Y., and ROMANOV, A. E., 1992, Phys. Stat. Sol. (a), 129, 117.
-
(1992)
Phys. Stat. Sol. (a)
, vol.129
, pp. 117
-
-
Gutkin, M.Y.1
Romanov, A.E.2
-
15
-
-
5644245489
-
-
GUTKIN, M. Y., and SHEINERMAN, A. G., 2001, Phys. Stat. Sol. (a), 184, 485.
-
(2001)
Phys. Stat. Sol. (a)
, vol.184
, pp. 485
-
-
Gutkin, M.Y.1
Sheinerman, A.G.2
-
17
-
-
0040973561
-
-
KATO, M., FUJII, T., and ONAKA, S., 1996, Mater. Sci. Engng, A211, 95.
-
(1996)
Mater. Sci. Engng
, vol.A211
, pp. 95
-
-
Kato, M.1
Fujii, T.2
Onaka, S.3
-
18
-
-
0035430062
-
-
KONSTANTINOV, O. V., KOTELNIKOV, E. Y., MATVEENTSEV, A. V., and ROMANOV, A. E., 2001, Tech. Phys. Lett., 27, 683.
-
(2001)
Tech. Phys. Lett.
, vol.27
, pp. 683
-
-
Konstantinov, O.V.1
Kotelnikov, E.Y.2
Matveentsev, A.V.3
Romanov, A.E.4
-
19
-
-
0346955939
-
-
MATTHEWS, J. W., and BLAKESLEE, A. E., 1974, J. Cryst. Growth, 27, 118; 1975, ibid., 29, 273; 1976, ibid. 32, 265.
-
(1974)
J. Cryst. Growth
, vol.27
, pp. 118
-
-
Matthews, J.W.1
Blakeslee, A.2
-
20
-
-
33744558557
-
-
MATTHEWS, J. W., and BLAKESLEE, A. E., 1974, J. Cryst. Growth, 27, 118; 1975, ibid., 29, 273; 1976, ibid. 32, 265.
-
(1975)
J. Cryst. Growth
, vol.29
, pp. 273
-
-
-
21
-
-
4143078533
-
-
MATTHEWS, J. W., and BLAKESLEE, A. E., 1974, J. Cryst. Growth, 27, 118; 1975, ibid., 29, 273; 1976, ibid. 32, 265.
-
(1976)
J. Cryst. Growth
, vol.32
, pp. 265
-
-
-
24
-
-
0031381645
-
-
PEHLKE, E., MOLL, N., KLEY, A., and SCHEFFLER, M., 1997, Appl. Phys. A, 65, 525.
-
(1997)
Appl. Phys. A
, vol.65
, pp. 525
-
-
Pehlke, E.1
Moll, N.2
Kley, A.3
Scheffler, M.4
-
25
-
-
0342484491
-
-
TILLMANN, K., and FOSTER, A., 2000, Thin Solid Films, 368, 93.
-
(2000)
Thin Solid Films
, vol.368
, pp. 93
-
-
Tillmann, K.1
Foster, A.2
-
26
-
-
0026238754
-
-
TRUSOV, L. I., TANAKOV, M. Y., GRYAZNOV, V. G., KAPRELOV, A. M., and ROMANOV, A. E., 1991, J. Cryst. Growth, 114, 133.
-
(1991)
J. Cryst. Growth
, vol.114
, pp. 133
-
-
Trusov, L.I.1
Tanakov, M.Y.2
Gryaznov, V.G.3
Kaprelov, A.M.4
Romanov, A.E.5
-
27
-
-
0043269788
-
-
USAMI, N., ICHITSUBO, T., UJIHARA, T., TAKAHASHI, T., FUJIWARA, K., SAZAKI, G., and NAKAJIMA, K., 2003, J. appl. Phys., 94, 916.
-
(2003)
J. Appl. Phys.
, vol.94
, pp. 916
-
-
Usami, N.1
Ichitsubo, T.2
Ujihara, T.3
Takahashi, T.4
Fujiwara, K.5
Sazaki, G.6
Nakajima, K.7
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