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Materials Science and Engineering: B

Volumn 178, Issue 17, 2013, Pages 1124-1129

Structural and luminescence correlation of annealed Er-ZnO/Si thin films deposited by AACVD process

(5) Elleuch, R a Salhi, R b Maalej, N c Deschanvres, J L d Maalej, R a

a University of Sfax (Tunisia)

b UNIVERSITY OF SFAX (Tunisia)

c KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS (Saudi Arabia)

d LABORATOIRE DES MATÉRIAUX ET DU GÉNIE PHYSIQUE (France)

Author keywords

AACVD; Erbium; Photoluminescence; ZnO

Indexed keywords

ANNEALING; ATMOSPHERIC PRESSURE; CHEMICAL VAPOR DEPOSITION; ERBIUM; II-VI SEMICONDUCTORS; METALLIC FILMS; SEMICONDUCTOR DOPING; SILICON COMPOUNDS; THIN FILMS; ZINC SULFIDE;

AACVD; AEROSOL ASSISTED CHEMICAL VAPOR DEPOSITIONS (AACVD); DOPED ZNO THIN FILMS; ER-DOPED; GREEN EMISSIONS; SYNTHESISED; TETRAMETHYL; THIN-FILMS; ZINC ACETATE DIHYDRATE; ZNO FILMS;

ZINC OXIDE;

EID: 84881519290 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/j.mseb.2013.07.005 Document Type: Article

Times cited : (24)

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