Synthesis, microstructural characterization and optical properties of undoped, v and Sc doped ZnO thin films

Journal of Alloys and Compounds

Volumn 509, Issue SUPPL. 1, 2011, Pages

  Amezaga Madrid P ^a   Antunez Flores W ^a   Ledezma Sillas, J E ^a   Murillo Ramirez J G ^a   Solis Canto O ^a   Vega Becerra, O E ^a   Martinez Sanchez R ^a   Miki Yoshida, M ^a  

^a CENTRO DE INVESTIGACIÓN EN MATERIALES AVANZADOS   (Mexico)

Author keywords

Electronic band structure; Scanning and Transmission Electron Microscopy; Thin films; Vapour deposition; X ray Diffraction

Indexed keywords

AEROSOL-ASSISTED CHEMICAL VAPOUR DEPOSITIONS; AVERAGE GRAIN SIZE; DOPANT MATERIALS; DOPED ZINC OXIDE THIN FILMS; DOPED ZNO; ELECTRONIC BAND STRUCTURE; GRAZING INCIDENCE X-RAY DIFFRACTION; MICRO-STRUCTURAL CHARACTERIZATION; NONMAGNETICS; P TYPE CONDUCTIVITY; PRECURSOR SOLUTIONS; RMS ROUGHNESS; SCANNING AND TRANSMISSION ELECTRON MICROSCOPY; SEMICONDUCTOR OXIDES; SPECULAR REFLECTANCE; TIO; TRANSMITTANCE SPECTRA; VAPOUR DEPOSITION; ZNO;

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; COBALT; DEPOSITION; DIFFRACTION; DOPING (ADDITIVES); ENERGY GAP; MAGNETIC PROPERTIES; MANGANESE; METALLIC FILMS; MICROSTRUCTURE; OPTICAL CONSTANTS; OPTICAL FILMS; OXIDE FILMS; SCANDIUM; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TITANIUM DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY; VANADIUM; X RAY DIFFRACTION; ZINC OXIDE;

OPTICAL PROPERTIES;

EID: 79957465619     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2011.01.044     Document Type: Conference Paper

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