Thickness dependence of the growth of magnetron-sputtered TiO2 films studied by Raman and optical transmittance spectroscopy

Journal of Applied Physics

Volumn 114, Issue 1, 2013, Pages

  Mukherjee, S K ^a   Mergel, D ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT STATE; GROWTH PROCESS; HALF-WIDTH; OPTICAL TRANSMITTANCE SPECTRUM; RAMAN INTENSITIES; SPUTTERED FILMS; THICKNESS DEPENDENCE; TRANSMITTANCE SPECTROSCOPIES;

OPACITY; TITANIUM DIOXIDE;

FILM GROWTH;

EID: 84880909031     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4811682     Document Type: Article

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