Growth mode and oxidation state analysis of individual cerium oxide islands on Ru(0001)

Ultramicroscopy

Volumn 130, Issue , 2013, Pages 87-93

  Flege, J I ^a   Kaemena, B ^a   Senanayake, S D ^b   Hocker J ^a   Sadowski, J T ^b   Falta, J ^a  

^a UNIVERSITY OF BREMEN   (Germany)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

Ceria; Low energy electron microscopy and diffraction; Oxide films; Rare earth oxides

Indexed keywords

HEXAGONAL SUBSTRATES; HIGH GROWTH TEMPERATURES; LOW ENERGY ELECTRON MICROSCOPY; MIS-ORIENTATION; OXIDATION STATE; RARE EARTH OXIDE; SUBSTRATE MORPHOLOGIES; VALENCE BAND PHOTOEMISSION;

DIFFRACTION; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS; GROWTH TEMPERATURE; MOLECULAR BEAM EPITAXY; OXIDE FILMS; OXIDES;

CERIUM COMPOUNDS;

CERIUM OXIDE; RUTHENIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONTROLLED STUDY; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; FLAME PHOTOMETRY; GROWTH RATE; LOW ENERGY ELECTRON MICROSCOPY; MOLECULAR MODEL; NANOANALYSIS; OXIDATION KINETICS; STRUCTURE ANALYSIS; SURFACE PROPERTY; TEMPERATURE MEASUREMENT;

EID: 84880801875     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.04.007     Document Type: Article

References (23)

1. Catalysis by Ceria Related Materials 2001, Imperial College Press. A. Trovarelli (Ed.).
2. Da Silva J.L.F. Physical Review B 2007, 76:193108.
3. Flege J.I., Vescovo E., Nintzel G., Lewis L.H., Hulbert S., Sutter P. Nuclear Instruments and Methods in Physics Research Section B 2007, 261:855-858.
4. Madey T.E., Engelhardt H.A., Menzel D. Surface Science 1975, 48:304-328.
5. Flege J.I., Hrbek J., Sutter P. Physical Review B 2008, 78:165407.
6. Kaemena B., Senanayake S.D., Meyer A., Sadowski J.T., Falta J., Flege J.I. Journal of Physical Chemistry C 2013, 117:221-232.
7. Fölsch S., Barjenbruch U., Henzler M. Thin Solid Films 1989, 172:123-132.
8. Schwennicke C., Schimmelpfennig J., Pfnür H. Surface Science 1993, 293:57-66.
9. Sutter P.W., Flege J.-I., Sutter E.A. Nature Materials 2008, 7:406-411.
10. Sutter E., Albrecht P., Sutter P. Applied Physics Letters 2009, 95:133109.
11. Sutter E., Albrecht P., Camino F.E., Sutter P. Carbon 2010, 48:4414-4420.
12. Schmidt T., Heun S., Slezak J., Diaz J., Prince K.C., Lilienkamp G., Bauer E. Surface Review and Letters 1998, 5:1287-1296.
13. Tromp R.M. Ultramicroscopy 2012, 120:73-77.
14. Flege J.I., Sutter P. Journal of Physics. Condensed Matter 2009, 21:314018.
15. Mullins D.R., Overbury S.H., Huntley D.R. Surface Science 1998, 409:307-319.
16. Lindroos M., Pfnür H., Held G., Menzel D. Surface Science 1989, 222:451-463.
17. Mullins D.R., Radulovic P.V., Overbury S.H. Surface Science 1999, 429:186-198.
18. Lu J.-L., Gao H.-J., Shaikhutdinov S., Freund H.-J. Surface Science 2006, 600:5004-5010.
19. Schmid A.K., Świȩch W., Rastomjee C.S., Rausenberger B., Engel W., Zeitler E., Bradshaw A.M. Surface Science 1995, 331-333:225-230.
20. Chung W.F., Feng Y.J., Poon H.C., Chan C.T., Tong S.Y., Altman M.S. Physical Review Letters 2003, 90:216105.
21. Hannon J.B., Sun J., Pohl K., Kellogg G.L. Physical Review Letters 2006, 96:246103.
22. Flege J.I., Sutter P. Physical Review B 2008, 78:153402.
23. Flege J.I., Meyer A., Falta J., Krasovskii E.E. Physical Review B 2011, 84:115441.