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Volumn 261, Issue 1-2 SPEC. ISS., 2007, Pages 855-858

A new soft X-ray photoemission microscopy beamline at the National Synchrotron Light Source

Author keywords

Low energy electron microscopy; Photoemission electron microscopy; Synchrotron radiation

Indexed keywords

LOW-ENERGY ELECTRON MICROSCOPY; PHOTOEMISSION ELECTRON MICROSCOPY; SOFT X-RAY;

EID: 34447265058     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.04.095     Document Type: Article
Times cited : (23)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.