Characterization of Fe-N nanocrystals and nitrogen-containing inclusions in (Ga,Fe)N thin films using transmission electron microscopy

Journal of Applied Physics

Volumn 114, Issue 3, 2013, Pages

  Kovacs A ^a   Schaffer, B ^b,c   Moreno, M S ^d   Jinschek, J R ^e   Craven, A J ^c   Dietl, T ^f,g   Bonanni, A ^h   Dunin Borkowski, R E ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b DARESBURY LABORATORY   (United Kingdom)

^c UNIVERSITY OF GLASGOW   (United Kingdom)

^d CENTRO ATÓMICO BARILOCHE   (Argentina)

^e Thermo Fisher Scientific   (United States)

^f INSTITUTE OF PHYSICS   (Poland)

^g UNIVERSITY OF WARSAW   (Poland)

^h JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION; HOLE DRILLING; N LAYERS; NANOMETRICS; NITROGEN GAS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STEM IMAGES;

ELECTRON ENERGY LOSS SPECTROSCOPY; GALLIUM; NANOCRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

NITROGEN;

EID: 84880778113     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4816049     Document Type: Article

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